Inspire - AFM-Based IR Overview



AFM-Based IR Nanocharacterization System

Providing highest resolution nanochemical and properties mapping

  • Enabling highest resolution characterization of nanochemistry and plasmonics through a direct optical approach
  • Providing unrivaled quantitative properties mapping with PeakForce Tapping technology
  • Expanding nanochemical imaging to previously inaccessible samples with new PeakForce IR
  • Delivering fastest time to data through ScanAsyst automatic image optimization and integrated sSNOM optics

Bruker’s Inspire™ delivers, for the first time, highest-resolution nanoscale chemical and property mapping combined with radical productivity advances and uncompromised AFM performance. The integrated, self-optimizing system acquires nanoscale infrared absorption and reflection maps at regular AFM imaging speeds, without the limitations of indirect mechanical approaches or added complexity for the user.

Taking full advantage of Bruker’s exclusive PeakForce Tapping® technology, Inspire’s new approach to infrared scattering scanning near-field optical microscopy (sSNOM) extends its capability to nanoscale chemical mapping of a wide variety of samples. The new technique, PeakForce IR™, interleaves sSNOM signal acquisition with PeakForce Tapping feedback, providing the full combined set of information at the same time.

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