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Instrumentation for Analysis in the Nano-World

Atomic Force Microscopy (AFM) and Scanning Probe Microscopy (SPM)

Bruker’s atomic force microscopes (AFMs) drive the world’s leading-edge research in life science, materials science, semiconductor, electrochemistry, and many other applications. These instruments have brought nanoscale investigation to every scientific discipline, and the decades of experience in proprietary AFM metrology at our disposal enables us to deliver unparalleled accuracy and resolution at price points for every budget. More info

Optical Surface Profilometry

Based on ten generations of proprietary technology advances, Bruker’s white light interferometric profilers feature patented, higher brightness dual-LED illumination that, when combined with the systems’ superior vertical resolution, provide the high sensitivity and stability necessary for precision, non-contact 3D surface metrology in applications and environments that are challenging for other metrology systems. More info

Stylus Surface Profilometry

Bruker’s stylus profilers are the culmination of four decades of proprietary stylus profiler technology. These surface profilers provide repeatable, accurate measurements on varied surfaces, from traditional 2D roughness surface characterization and step height measurements to advanced 3D mapping and film stress analyses. More info

Tribology and Mechanical Testing

Measuring friction, wear and material mechanical properties is a way for engineers to understand how materials, coatings and lubricants will stand up to the rigors of very varied applications, from heavy industry to semiconductor, from automotive to biomedical. Bruker's macro, micro and nano testers set the gold standard for stressing materials under many conditions and measuring the reaction with highest accuracy. More info

QUANTAX EDS for SEM and S/TEM

Bruker's unique QUANTAX systems for X-ray microanalysis (EDS) on scanning electron microscopes (SEM) and (scanning) transmission electron microscopes (S/TEM) are leading in performance for all tasks in elemental analysis.

QUANTAX CrystAlign Electron Backscatter Diffraction (EBSD)

The QUANTAX CrystAlign EBSD system is fully integrated with the QUANTAX EDS system under a single user interface and therefore comfortable and easy to use. The e-Flash detector series provides superior performance and flexibilty in measurement setup through the in-situ tilt option, including simultaneous EDS and EBSD measurement. More info

Micro X-ray Fluorescence Spectrometry

Micro X-ray fluorescence spectrometry (µ-XRF) is the method of choice for elemental analysis with X-ray excitation and high spatial resolution. What distinguishes µ-XRF from standard X-ray fluorescence spectrometry is that the tube-generated X-ray beam is either collimated or focused to spot sizes ranging from 25 to 2 mm. Bruker's range of products for µ-XRF consists of

  • the M4 TORNADO, top-of-the-line instrument for 2D analysis at highest spatial resolution
  • the M1 MISTRAL tabletop µ-XRFR spectrometer for metals. layers and jewelry analysis
  • the M1 ORA compact tabletop jewelry analyzer
  • the ARTAX mobile spectrometer for archeometry applications.

Total Reflection X-ray Fluorescence Spectrometry

Total Reflection X-ray Fluorescence Spectrometry (TXRF) is the only X-ray technology offering low ppb detection limits. TXRF is the method of choice for multi-element analysis of smallest sample amounts down to nano gram. It can be applied to liquid and solid samples, suspensions, filters, particles, contaminations, etc. The S2 PICOFOX tabletop TXRF spectrometer is a compact, portable device which does not require any media or consumables.