Overview

Optical Metrology Module

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Optical Metrology Module

Stand-alone, white light interferometric metrology for critical measurement needs

The technology that powers the Wyko NT series optical profilers is now available in a flexible, stand-alone module.

The Optical Metrology Module or OMM gives you non-contact, gauge-capable metrology for the critical measurement requirements of a wide range of applications.

The Optical Metrology Module brings high-speed, automated optical profiling metrology to the factory floor.

Features

  • Stand-alone system allows non-contact, gauge-capable metrology
  • Provides in-situ production measurement and even 100% sampling
  • Interfaces easily with production systems (mechanical, electrical and data)

More info

Bruker´s Support Programs – Nano Surfaces Business (PDF brochure)