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5-on-1 reality: Bruker’s range of analytical tools for SEM

Bruker Nano Analytics

Bruker presents a new variety of choice in instrumentation by expanding its portfolio of high-performance analytical tools for materials characterization in electron microscopes.

With the introduction of the new XSense WD spectrometer and the new XTrace X-ray source for Micro-XRF on SEM, Bruker is the first company to offer all 5 analytical techniques, EDS, WDS, EBSD, Micro-XRF and Micro-CT, for the SEM.

Another step ahead is the new 4-in-1 software ESPRIT 2.0., which seamlessly integrates EDS, EBSD, WDS and Micro-XRF under a single user interface and allows researchers to combine data obtained by these complementary methods.

Besides this unparalleled range of analytical tools for electron microscopes, Bruker also offers a variety of X-ray fluorescence micro analyzers for spatially resolved composition analysis and for trace element analysis for a multitude of applications in industry and research.

As a pioneer in instrumentation for X-ray micro- and nano-analysis, Bruker delivers to you innovative high-performance technology. With our worldwide network of service centers and application specialists we are always close to your analytical needs.