X-ray Diffraction

Materials property characterization from fundamental research to industrial quality control

Bruker's X-ray diffraction portfolio covers a wide range of X-ray scattering techniques for materials characterization and quality control of crystalline or non-crystalline materials such as powders, solid blocks, thin films or liquids.

Techniques include X-ray powder diffraction (XRPD), diffuse or "total" scattering (PDF analysis), small angle X-ray scattering (SAXS), thin-film analysis, and X-ray imaging. A unique platform design allows to configure each instrument for a wide range of applications.