QUANTAX for SEM - Technical Details

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QUANTAX EDS for SEM

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QUANTAX with XFlash® 6

Excellence in X-ray Analysis on the Electron Microscope

Icon Detector Areas

Wide range of detector sizes

  • 10, 30, 60 and 100 mm2 area detectors offer ideal solutions for microanalysis and nano-analysis

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Icon Energy Resolution

Best energy resolution for light element and low energy analysis

  • ƒƒ121 eV limited edition
  • ƒƒ123 eV ultimate
  • ƒƒ126 eV premium
  • ƒƒ129 eV standard
  • ƒƒAll resolutions specified exceeding ISO 15632:2002 requirements

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Icon High Speed Pulse Processing

Ultra high throughput for fastest measurements

  • ƒƒNew signal processing unit with hybrid technology
  • ƒƒOver 1,500 kcps input count rate
  • Up to 600 kcps output count rate

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Icon Slim-line Detector Technology

Slim-line detector technology for even more counts and lower beam currents

  • ƒƒShortest detector to sample distances for maximum solid angle in SEM, FIB-SEM and microprobe

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Icon Compact and Light-weight Design

Compact design and low weight

  • ƒƒHigh precision slider with fully integrated motor for precise positioning
  • Improved heat sink geometry for stable measurement conditions
  • Maximum detector weight of 3.75 kg

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