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Scanning Probe Microscopy

Part No Location Dates Duration Language
BRA001AFM-PT Brazil 31/05/-02/06/2017 3 days Portuguese/English

Bruker SPM Class will consolidate theoretical and practical principles of Scanning Probe Microscopy, in particular, Atomic Force Microscopy. This aim of this class will provide the right way to extract the maximum quality results in SPM equipment.


  • SPM basic
  • AFM basic principles
  • Microscope components operation
  • Software control
  • Scanning Modes
  • Contact Mode
  • Tapping Mode
  • Force spectroscopy
  • Force volume
  • PeakForce Tapping Mode.


  • Sample Preparation
  • Sample analysis in AFM
  • Digital images
  • Brightness and contrast
  • Filters
  • PeakForce Tapping Mode Analysis.