From modulus measurements in the mega- to gigapascal range, adhesion and frictional maps, calorimetric and electrical data, correlated nanoscale AFM, and Raman spectroscopy to three-dimensional morphological plots with sub-nanometer accuracy, Bruker has the AFM solution for your problem.
For investigating the functionality of nano-structured material, especially the so-called novel meta-material, in different wavelength ranges, the FT-IR serves as a powerful tool as it can easily measure the bulk optical response in reflectance and transmittance modes. This technique is well-established in the photonic industry.
