• Dimension FastScan Pro - Brochure 2.5MB
The Dimension FastScan Pro™ with PeakForce Tapping® deliversthe highest metrology-level speed and performance of any industrial atomic force microscope (AFM) available today. Designed specifically for high-volume, production environments, FastScan Pro enables automated or semi-automated measurements while ensuring the utmost ease of use and the lowest cost per measurement for quality control, quality assurance, and failure analysis.
Bruker’s exclusive PeakForce Tapping® is the most significant scientific breakthrough in atomic force microscope (AFM) technology since the introduction of TappingMode™. It provides unprecedented high resolution imaging, extends AFM measurements into a range of samples not previously accessed and uniquely enables simultaneous nanoscale property mapping.
• AutoMet AFM Software - Datasheet 1.6MB
Bruker’s AutoMET™ software brings high-volume, precise AFM measurements to demanding production environments. Available for Dimension FastScan® and Dimension Icon® systems, AutoMET uniquely enables the combination of high-resolution AFM imaging with fast, automated metrology.