The Dimension XR Nanomechanics configuration for Icon and FastScan AFM systems provides the complete set of capabilities necessary to rapidly and quantitatively characterize materials for their nanomechanical characteristics, on samples ranging from soft sticky hydrogels and composites to stiff metals and ceramics.
The XR Nanomechanics bundled solution encompasses the full evolution of nanoscale AFM nanomechanical measurement techniques, including Bruker’s new, revolutionary AFM nano-dynamic measurement analysis. This is the first and only AFM solution that ties to bulk DMA.
For the first time an AFM can provide complete and quantitative viscoelastic analysis of polymers at the nanoscale, probing materials at rheologically relevant frequencies, in the linear regime. Proprietary dual-channel detection, phase-drift correction, and reference frequency tracking enable a small strain measurement in the rheologically relevant 0.1 Hz to 20 kHz range for nanoscale measurements of storage modulus, loss modulus, and loss tangent that tie directly to bulk DMA.