Researchers map variations of electrical conductivity for a range of studies and processes, including electrical defect characterization and investigation of conductive polymers, semiconductors, nanotubes, and even certain organic materials.
Conductive AFM (C-AFM), and the related modes Tunneling AFM (TUNA) and PeakForce TUNA™, are powerful current-sensing techniques that represent part of Bruker’s array of Nanoelectrical Characterization Modes.
C-AFM is a secondary imaging mode derived from Contact Mode that characterizes conductivity variations across medium- to low-conducting and semiconducting materials. It is used to measure and map current in the 2pA to 1µA range while simultaneously collecting topographic information.
