Elastic and Viscoelastic Property Characterization
Modulus Mapping raster scans the indenter probe over the sample surface with a small oscillatory force while monitoring the resultant displacement and phase lag due to material response. A single scan of an area provides topographic information, stiffness, storage and loss modulus, and tan delta maps. This micron-area characterization technique provides the information necessary to guide the researcher to areas that may require further investigation of nanoDMA, such as single-point frequency or load sweeps.