Elastic Modulus | Bruker

Elastic Modulus

Quantitative Elastic Modulus Characterization at the Nanoscale

Nanoindentation is a powerful technique to quantitatively measure the indentation modulus of localized microstructures, interfaces, small surface features, and thin films. During a nanoindentation test, a probe of a well-known geometry is pressed into the surface of the material as the applied force and resulting indenter displacement is continuously measured. The acquired force-displacement curve is the nanoscale mechanical fingerprint of the material and provides a highly sensitive measurement of the probe/sample contact stiffness, from which the indentation modulus can be quantitatively calculated.

Bruker is the world-leader in developing nanomechanical test instruments for indentation modulus characterization. Unique capacitive transducer technologies combined with nanometer precision test placement accuracy and superior control over the nanoindentation process enable quantitative, high-accuracy modulus measurements at the nanoscale. Bruker’s suite of nanomechanical testing technologies enable nanoscale-to-microscale modulus characterization capabilities on the broadest range of materials—from ultra-thin films to traditional bulk materials.

Standalone Equipment for Elastic Modulus Characterization

Hysitron TI 980 TriboIndenter | Bruker

TI 980 TriboIndenter

Bruker's most advanced nanomechanical and nanotribological test instrument, operating at the intersection of maximum performance, flexibility, reliability, sensitivity and speed.

Hysitron TI Premier | Bruker

TI Premier

Versatile nanomechanical and nanotribological test instrument, supporting a broad range of hybrid and correlative characterization techniques.

Hysitron TS 77 Select Nanoindenter | Bruker

TS 77 Select

Dedicated nanomechanical test instruments, providing an essential toolkit of core nanoscale mechanical characterization techniques.

Microscope Instruments for Elastic Modulus Characterization

Hysitron PI 85L SEM PicoIndenter | Bruker

PI 85L SEM PicoIndenter

Depth-sensing nanomechanical test instrument that can be interfaced with scanning electron microscopes (SEM).

Hysitron PI 8X SEM PicoIndenter BRUKER

PI 89 SEM PicoIndenter

Bruker’s comprehensive in-situ nanomechanical test instrument for SEM and FIB/SEM, featuring our full suite of techniques.

Hysitron PI 95 TEM PicoIndenter | Bruker

PI 95 TEM PicoIndenter

The first full-fledged depth-sensing indenter capable of direct-observation nanomechanical testing inside a transmission electron microscope (TEM).


Hysitron TS 75 TriboScope | Bruker

TS 75 TriboScope

Quantitative, rigid-probe nanoindentation and nanotribological characterization on your existing AFM.