10 nm Chemical Imaging and High-Speed Nanoscale FTIR Spectroscopy
Bruker Anasys Instruments’ latest generation, patented AFM-IR technique achieves sub-monolayer sensitivity with <10 nm spatial resolution for chemical imaging and nanoFTIR spectroscopy.
FASTspectra provides the highest performance nanoscale IR spectroscopy with unrivalled signal to noise performance, broadband IR spectroscopy in seconds and direct correlation to bulk FTIR techniques.
Tapping AFM-IR is the latest generation AFM-IR imaging mode that provides <10 nm resolution chemical imaging and simultaneous mechanical property mapping and topography.