QUANTAX Compact consists of a XFlash® 600 Mini silicon drift detector (SDD), a small electronics unit and the intuitive software ESPRIT Compact.
The system performs qualitative and quantitative analyses of all materials with an element range from boron (5) to californium (98). Besides composition analysis at individual spots on the sample surface, QUANTAX Compact provides powerful line scan and spectral element mapping functions.
By using QUANTAX Compact, the analysis and reporting is completed within seconds.