M4 TORNADOPLUS is the world's first Micro-XRF spectrometer that enables the detection and analysis of the entire element range from carbon to americium. As the latest member of the proven, market leading family of M4 TORNADO Micro-XRF analyzers, the M4 TORNADOPLUS also offers additional unique features, such as an innovative aperture management system, an ultra-high throughput pulse processor and a flexible quick-change sample stage.
Using two large-area silicon drift detectors with super light element window and a specifically optimized Rh X-ray tube, the M4 TORNADOPLUS is the first Micro-XRF spectrometer ever to enable the analysis of light elements. Unlike common Micro-XRF systems, which are suitable to detect elements from sodium up, the M4 TORNADOPLUS allows to also measure elements with atomic numbers Z<11, such as fluorine, oxygen, nitrogen and carbon, without compromising the performance and sensitivity in the higher energy ranges. With this performance enhancement, new applications are opening up for Micro-XRF, e.g. in geoscience and mining, biology, polymer research or semiconductor industry.
Already the previous dual detector versions of the M4 TORNADO have been trendsetting in this regard, providing up to 260 kcps output count rate with excellent energy resolution. With its unique ability to process up to 1,200 kcps and to deliver an output count rate of up to 550 kcps, the M4 TORNADOPLUS pushes these limits significantly further, enabling unmatched acquisition speed and productivity.
Many specimens to be investigated using Micro-XRF have topographic surfaces, rather than being perfectly flat. Therefore, just like in photography, the depth of field becomes an important parameter for the X-ray optical system used to generate the small excitation spot on the sample surface. Usually, in Micro-XRF analyzers with high spatial resolution X-ray optics, the working distance needs to be as small as a few mm and the achievable depth of field is less than 1 mm.
The innovative, software-controlled aperture management system (AMS) of the M4 TORNADOPLUS enables a working distance of approx. 9 mm and provides a depth of field of up to approx. 5 mm. That means, the spatial resolution does not get lost, and sample features are kept in focus, even if the sample surface varies over several millimeters. This makes the M4 TORNADOPLUS the instrument of choice for the analysis of specimens with strong topography, e.g. in electronics, forensics, or geoscience.
The M4 TORNADOPLUS also offers a quick-change stage interface and optional special drill core and thin section carriers. These accessories allow the specimens to be placed and fixed quickly and securely onto a removable stage plate and make it easy to attach or exchange specimens for a faster and more secure analysis as well as reanalysis. This saves time both in specimen exchange as well as in measurement set-up, as the specimens will always be at the same height and position.