software, X-ray diffraction, DIFFRAC.SUITE

DIFFRAC.XRR Software - Two approaches for data evaluation

Quick XRR analysis using FFT estimation

Quick XRR Analysis using FFT Estimation

You are interested in layer thicknesses only?

DIFFRAC.XRR sets the benchmark: With a single mouse-click, the Estimate tool evaluates the layer thicknesses via a Fast Fourier Transform and directly adds the result into the corresponding graph of the XRR measurement.

The advantage of this methode is, that it does not require any pre-knowledge about the sample under investigation.

Detailed XRR analysis via full fitting

Detailed XRR Analysis via Full Fitting

You need to know about all properties?

For detailed analysis DIFFRAC.XRR performs accurate simulations – applying dynamical scattering theory – to optimize the parameters of the sample model (e.g. thickness, roughness, mass density) by least-squares fitting.

Experimental effects like instrumental resolution, background and the influence of the sample size are taken into account to precisely describe the measurements. Fast and reliable fitting algorithms ensure fast convergence and provide reliable results.

Comprehensive material database

Comprehensive Material Database

DIFFRAC.XRR features a comprehensive and user extendable material database for amorphous and crystalline materials as well as mixed crystals up to quaternary compounds.

The database includes calculation of structure factors or hkl patterns as well as X-ray properties like absorption, penetration depth, index of refraction, polarizability, etc.

DIFFRAC.XRR sets new standards: The use of additional user-defined variables in the definition of the sample model extends the flexibility and application range significantly.

Sample model definition with unparalleled flexibility

Sample Model Definition with Unparalleled Flexibility

From simple single layer samples to highly complex samples containing superlattices and gradients - DIFFRAC.XRR masters them all.

Various interfacial roughness models enable a more accurate description of the different growth morphologies. The linking of layer parameters allows to impose constraints to the sample model.

The availability of additional free variable sets new standards in the flexibility of sample modelling.

Extensive reporting capabilities

Extensive Reporting Capabilities

DIFFRAC.XRR includes a professional reporting system for creating publication ready graphics and full analysis reports.

You can design your propriatary report format and save it as a template.

Reports can either be printed directly, shared as pdf-file, or further edited via .docx documents.



Routine X-ray reflectivity analysis has never been easier.

Record your own macros and repeat them completely in a single run or in a step-by-step mode. Workflows assist through the analysis or run even fully automated – from import of the measurement data to the reporting of the results.