EFNS Amsterdam

4th Annual European Forum on Nanoscale IR Spectroscopy

EFNS 2019 international conference connects leading scientists in the field of nanoscale Infra-Red spectroscopy and sSNOM. This interactive forum benefits anyone interested in nanoscale characterisation of chemical and physical properties in polymers, 2D materials, materials science, life sciences, pharmaceuticals and micro-electronics. The program is designed to facilitate information sharing so that it is valuable for expects and novices and includes poster competitions and social events.

This year’s meeting will be organized at Amsterdam’s Science Park, home to the University of Amsterdam’s Faculty of Science and is hosted by Rd. Erik van Heumen from the Van der Waals Zeeman Institute.

Key Topics:

The conference covers new technology developments and exciting application discoveries made using photothermal-based nanoIR spectroscopy and scattering SNOM. The technique will be introduced from first principles and all key application fields will be covered from life sciences to 2D materials.

  • Oral presentations for leading researchers
  • Poster sessions
  • Extensive networking opportunities and social events
  • Demonstrations highlighting new Anasys/Bruker technology


Download conference program.


Poster Presentation - Authors of accepted abstracts are expected to present a poster. Poster session will be on Wednesday and Thursday, September 11 and 12, 2019.

Poster Awards - Top poster presentations will be selected to receive prizes. Attendees will also be able to vote for their favorite poster.

The submission deadline is August 15, 2019. Incomplete or late submissions will not be accepted.
Social activities with dinner on Wednesday 11, 2019.

Key Speakers

Professor Alexandre Dazzi

Alexandre Dazzi

Université Paris-Sud
Laboratoire de Chimie Physique

PD Dr. Karsten Hinrichs

Karsten Hinrichs

Research Group Leader In-Situ-Spectroscopy
Leibniz-Institut für Analytische Wissenschaften – ISAS – e. V.

Dr. Michaël Molinari

Michael Molinari

Full Professor
University of Bordeaux, France

Dr Lily Poulikakos

Lily Poulikakos

Swiss Federal Laboratories for Materials Science and Technology

Dr. Laurene Tetard

Laurene Tetard 1

Associate Professor
Physics Department
Nanoscience Technology Center
University of Central Florida

Dr. Erik Van Heumen

Erik Van Heumen

Associate Professor
Institute of Physics
University of Amsterdam

Natalia Piergies

Natalia Piergies

Assistant Professor
Department of Experimental Physics of Complex Systems Institute of Nuclear Physics
Polish Academy of Sciences



Simone Ruggeri, PhD.

Simone Ruggeri

Research Fellow
Department of Chemistry & Darwin College
University of Cambridge, Cambridge, UK

Dr Suzanne Morsch

Suzanne Morsch 200

Post Doctoral Research Associate
School of Materials
University of Manchester

Dr Cian Bartlam

Cian Bartlam 200

Research Fellow
School of Materials & National Graphene Institute
University of Manchester

Selwin Hageraats

Hageraats 200

PhD Researcher
Rijksmuseum Amsterdam
Conservation & Science Department

Dr. Luca Quaroni

Luca Quaroni

Faculty of Chemistry, Jagiellonian University
Kraków, Poland

Dr. Mike Casford

Mike Casford 200

Principal Research Associate
University of Cambridge
Department of Chemistry

Tom Vincent

Tom Vincent

National Physical Laboratory, UK

Alexey Kuzmenko

Alexey Kuzmenko

Senior Research Associate -
Université de Genève, Switzerland

Prof. Chanmin Su

Chanmin Su

Bruker Nano Inc, USA

Sissi de Beer

Sissi de Beer

Assistant Professor University of Twente

Featured Products


Anasys nanoIR3 angle left crop

The nanoIR3 is the latest generation nanoscale IR spectroscopy, chemical imaging, and property mapping system for both materials and life science applications.

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The nanoIR3-s draws on a legacy of award winning products and represents the state of the art for nanoscale spectroscopy, imaging and materials analysis.

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  • Correlative microscopy with nanoscale property mapping and full featured AFM
  • "Anasys engineered" for ease of use, productivity and reliability