FT-IR Emission Spectroscopy part III
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The first part, taken place in July, generated significant interest and explained the general setup of emission experiments and the determination of emissivity. The second part has successfully taken place on the 7th and 8th of October, gave an overview of photoluminescence (PL) measurements, which is a specific emission measurement technique widely used in the material/semiconductor science and optoelectronics.
Now in the third part, which does not imperatively require previous knowledge from the first two parts, we will have a closer look on the advanced techniques for emission and source characterization. In this session you will learn, how time-resolved spectroscopic technique like step scan is used as a powerful tool to figure out very weak emission signals and its benefits for characterization of e.g. pulsed lasers.