Scanning Probe Microscopy | Bruker

Scanning Probe Microscopy

Nanometer Precision Test Placement Accuracy for Reliable, Quantitative Characterization at the Nanoscale

Bruker is the pioneer and world-leader in scanning nanoindenters. Scanning Probe Microscopy (SPM) combined with nanomechanical testing provides the ability to rapidly visualize the topography of the surface prior to testing and position the nanoindentation probe on the desired test region with nanoscale precision. Additionally, post-test SPM imaging provides confirmation that the measurement was conducted in the desired testing location and valuable information regarding material deformation behavior.

Bruker’s proprietary high resolution in-situ SPM imaging utilizes the same probe to conduct topographic imaging as to perform the nanomechanical test. During an SPM image, the nanoindenter probe is raster scanned across the surface of the sample. Bruker’s patented capacitive transducer attached to a piezo scanner maintains a constant imaging force through a tightly controlled feedback loop. The sensitivity of Bruker's Hysitron transducer technology enables nano-Newton imaging contact forces, making topographical imaging of soft materials and delicate surface structures possible. Utilizing high-resolution SPM imaging, nanomechanical measurements can be placed within ±10nm of the desired testing location for reliable testing of individual microstructures, phases, and interfaces of material.

In-Situ SPM Enabled Standalone Nanoindenters

Hysitron TI 980 TriboIndenter | Bruker

TI 980 TriboIndenter

Bruker's most advanced nanomechanical and nanotribological test instrument, operating at the intersection of maximum performance, flexibility, reliability, sensitivity and speed.

Hysitron TI Premier | Bruker

TI Premier

Versatile nanomechanical and nanotribological test instrument, supporting a broad range of hybrid and correlative characterization techniques.

Hysitron TS 77 Select Nanoindenter | Bruker

TS 77 Select

Dedicated nanomechanical test instruments, providing an essential toolkit of core nanoscale mechanical characterization techniques.

In-Situ SPM Enabled Instruments for Microscopes

Hysitron TS 75 TriboScope | Bruker

TS 75 TriboScope

Quantitative, rigid-probe nanoindentation and nanotribological characterization on your existing AFM.

Hysitron PI 8X SEM PicoIndenter BRUKER

PI 89 SEM PicoIndenter

Bruker’s comprehensive in-situ nanomechanical test instrument for SEM and FIB/SEM, featuring our full suite of techniques.