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Transmission Kikuchi Diffraction in SEM

The Transmission Kikuchi Diffraction (TKD) technique has been recently introduced as a SEM based method capable of delivering the same type of results as EBSD but with a spatial resolution improved by up to one order of magnitude. The technique uses existing EBSD hardware and software but requires electron transparent samples, e.g. TEM lamella, free standing films and crystalline nanoparticles.

Recognizing the potential of this new technique Bruker decided to integrate it into the QUANTAX EBSD system. The TKD mode in QUANTAX EBSD is designed to be user friendly and allow the acquisition of high quality data regardless of the users’ experience level. TKD analyses with QUANTAX EBSD can also be combined with EDS analyses thanks to a special sample holder designed by Bruker.

TKD Professional Toolkit

The TKD Toolkit
The contents of the TKD toolkit
The TKD Sample Holder
The TKD sample holder in the open position

Bruker’s TKD Professional Toolkit makes it possible to combine TKD analyses with EDS measurements. The core piece of this toolkit is the special design TKD sample holder, which allows easy handling of any type of TEM samples and permits measurements even at 3 mm working distance.

Its special design ensures combined TKD/EDS measurements without shadowing effects and avoids collision risks even when operating at very low sample to detector distances.

The OPTIMUS™ TKD detector head

TKD Detector Head and Sample Holder
OPTIMUS TKD detector head and sample holder

Bruker’s high performance eFlash EBSD detector series can be fitted with the OPTIMUS™ TKD detector head which was specially designed for best sample-detector geometry for TKD analysis in SEM. The TKD detector head developed by Bruker features a horizontal phosphor screen which can be inserted underneath the electron transparent sample to acquire the diffracted electron signal where it is  strongest.

TKD optimized calibration assistant

The pattern center calibration algorithm has been adapted to function optimally in the TKD geometry, i.e. with the pattern center having PCy coordinate values much closer to zero or even negative. The pattern center calibration procedure is fully automatic.

Combined TKD/EDS measurements

Bruker’s TKD Professional Toolkit makes it possible to combine TKD analyses with QUANTAX EBSD with EDS measurements. The core piece of this toolkit is the special design TKD sample holder that allows easy handling of any type of TEM samples and permits measurements even at 3 mm working distance. Its special design ensures combined TKD/EDS measurements without shadowing effects and avoids collision risks even when operating at very low sample to detector distances.

FSE images in transmission mode

FSE image in transmission mode showing a network of dislocation walls
FSE image acquired in transmission
mode from a heavily deformed pure
Al sample, inserts show a network of
dislocation walls.

Acquiring forescatter electron (FSE) images with the ARGUS™ imaging system is now also possible in transmission mode. Transmission mode FSE images contain the same type of information as FSE images acquired in reflection mode, but offer more details.

FSE image in transmission mode showing individual dislocations
Color coded dark field image acquired in transmission mode from a heavily deformed pure Al sample, insert shows individual dislocations

Additionally to orientation contrast, the transmission mode FSE images can display networks of dislocation walls or even individual dislocations.

For more application examples of the TKD technique, please click here.

More info

ARGUS™– FSE/BSE imaging system (PDF flyer)

ARGUS™ application examples

OPTIMUS™ TKD detector head (PDF brochure)

TKD Webinar Banner