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RAPID EBSD

An Alternative to fast EBSD mapping

RAPID EBSD is a new and powerful ESPRIT 2 software package feature based on a method developed at Imperial College in London, UK. It combines high quality ARGUSTM ForeScatter (FSE) images with state-of-the-art image segmentation algorithms and sparse EBSD/EDS data acquisition to reconstruct normal EBSD/EDS maps in the shortest time possible.

Benefits

  • Increased efficiency
  • Fast mapping with long exposure times
  • Better statistics in EDS spectra
  • Less damage to beam sensitive samples
  • Reduced charging on non-conductive samples

Applications

  • Grain size statistics
  • Crystallographic texture
  • Materials producing very weak diffraction signal
  • Beam sensitive samples

Download RAPID EBSD flyer (PDF)