X-ray Diffraction (XRD) and Scattering (XRS)

Materials property characterization from fundamental research to industrial quality control

Bruker's X-ray portfolio covers a wide range of X-ray scattering techniques for materials characterization and quality control of crystalline or non-crystalline materials such as powders, solid blocks, nanoparticles, thin films, epitaxial layers, or liquids.

Techniques include X-Ray Powder Diffraction (XRPD) including Rietveld (TOPAS), diffuse or "total" scattering (PDF analysis), Small Angle X-Ray Scattering (SAXS) and analysis of amorphous, polycrystalline or epitaxial films using X-Ray Reflectometry (XRR), High-Resolution X-Ray Diffraction (HRXRD), Reciprocal Space Mapping (RSM). All of those can be executed on micron sized samples or areas of a larger sample called micro-XRD.

Thanks to the DAVINCI design of the D8 ADVANCE and the D8 DISCOVER easy switching between all the applications can be performed on a single, multipurpose system.

If XRPD is the main task, the D2 PHASER brings full performance in benchtop size and the D8 ENDEAVOR allows for automated, high sample throughput.

Bruker, AXS, Daltonics, BioSpin, Optics, Corporation

Our X-ray diffraction instruments

Our SAXS instruments

  • N8 HORIZON – compact small angle X-ray scattering system for advanced materials research
  • NANOSTAR – top of the line small angle X-ray scattering solution
  • MICRO Series – top-speed SAXS/WAXS for bio research

For more information please see our PDF file on X-ray Diffraction or contact us.