This training course will show the different methods used for orientation and residual stress measurement and analysis, including the DIFFRAC.TEXTURE and DIFFRAC.LEPTOS S software packages. The course is intended for users with experience in XRD, new users are strongly encouraged to first attend the X-ray Powder Diffraction or 2 Dimensional Diffraction course.
No dates scheduled
Because our courses are interactive and learner-oriented, we limit class size to a minimum of three and a maximum of six. Early enrollment is encouraged as registrations are accepted on a first-come/first-serve basis.
The course fee is $1,700 USD per attendee per two-day session.
For further information about the course content, please contact:
Applications Scientist, XRD
For information about price, registration, or other questions:
For a quotation, please contact: