On-Demand Session | 20 Minutes

Demo: New Platforms for AFM-IR

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This demonstration showcases the features of Bruker's soon-to-be-released advanced AFM-IR system. Submit the form for instant, full-length access.


Preview the unique capabilities of Bruker's newest AFM-IR platform, including:

  • Its integration with the new Nanoscope 6 controller.
  • The various advanced configuration options available for this platform.
  • Real-time demonstration of its sample-scanning and tip-scanning configurations, its operation while performing PeakForce QNM in air, and its achievement of otherwise unmatched lateral resolution.
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This presentation introduces the unique capabilities of a new Bruker platform coming out soon for AFM-IR imaging.

Looking at a sample of PMMA beads in epoxy resin, the presenter demonstrates the new platform's capability to achieve higher acuity and operate at higher scan speeds than other nanoIR systems. Its integration with both Bruker's most advanced AFM controller and its legacy Tapping mode imaging capabilities are explored. Moreover, the presenter showcases the user's ability to switch wavenumber and reconfigure laser power mid-scan (to look at both the epoxy band and the carbonyl band of the sample), and the platform's capacity to switch between sample-scanning and tip-scanning configurations during a single scan, thereby enabling investigation of the chemical composition and mechanical properties of the same sample using the same probe.