On-Demand Session | 15 Minutes

Demo: Surface Sensitivity Mode with nanoIR3

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This demonstration showcases the features of Bruker's newest nanoIR operational mode, performed on an Anasys nanoIR3 system. Submit the form for instant, full-length access.


Explore the capabilities and benefits of surface sensitivity mode, Bruker's newest operational mode for Anasys nanoIR systems.

  • Compare the results of standard resonance enhanced mode to surface sensitivity mode in real-time.
  • Understand how to navigate the analysis studio for Bruker nanoIR systems and configure drive and detection mode parameters, pulsing frequency, and laser power for surface sensitivity mode.
  • Learn to interpret surface sensitive data outputs, analyze the infrared signal, and identify the point at which the infrared signal saturates in a sample.



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The presenter will conduct a profile analysis of a PMMA wedge sample in both resonance enhanced and surface sensitivity modes. Comparison of the resultant data outputs demonstrates that using the same probe and sample, users can switch from looking at bulk measurements (where the signal increases linearly with the thickness) to measurements with a surface sensitivity on the order of 15 nm just by changing the parameters as is necessary to switch into surface sensitivity mode.

As a result, surface sensitivity mode enables measurement of the top layer of a sample with significantly improved accuracy, as it collects data only from the surface and not from the absorbing material beneath it. This is especially useful for looking at very small variations in a sample that may have non-absorbing regions or some extra particle on its surface.

This demonstration explores the key considerations for quantifying the infrared signal of any sample in this way.