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On-Demand Session | 20 Minutes

Deconvoluting Infrared Spectra from Stacked Films using Surface Sensitive AFM-IR

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Submit the form for instant, full-length access to this session and related recordings from this event. In this session, Cassandra Philips, Ph.D. (Application Scientist, Bruker) discusses and demonstrates the use of Bruker's newest nanoIR mode. 

 

Learn how to overcome the limits of traditional AFM-IR for the study of thin films and coatings.

  • Learn how and when to apply surface sensitive AFM-IR for accurate, efficient data acquisition.
  • Gain new insight into the practical limitations of traditional contact-mode AFM-IR for film and coating characterization and how the new surface sensitivie AFM-IR addresses them.
  • See Bruker's Anasys nanoIR3 characterize the surface topography and thickness of thick films, performed in real-time.
  • Hear experts answer audience questions about the best and most effective uses of surface sensitive AFM-IR for film and coating samples.

 

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LIVE DEMONSTRATION: THIN FILM ANALYSIS WITH NANOIR3

In this demonstration, the presenter will use the nanoIR3 to measure the film surface with traditional contact-mode AFM-IR, then switch to surface sensitive AFM-IR mode, showing how to reconfigure the instrument—including re-tuning the cantilever pulse rate and laser power—for surface sensitive mode. Conducting a profile analysis of the infrared intensity and thickness of the material enables us to clearly discriminate between the information available via traditional AFM-IR vs. surface sensitive AFM-IR.

Surface sensitive AFM-IR enables us to much more accurately measure the top layer of a thin film or coating sample, and also offers an alternative method of investigation to contact-mode AFM-IR for thick film samples that otherwise present high levels of spectral saturation due to their thickness.