X-ray Diffraction and Small Angle X-ray Scattering
The METALJET delivers the brightest X-ray beam of any home lab X-ray source.
Use both equally intense ports of this most powerful source to optimize your protein X-ray diffraction (PX) and small angle X-ray scattering (SAXS) experiments.
When it comes to X-ray diffraction, the D8 VENTURE with METALJET and PHOTON II detector provide you with an in-house system for X-ray crystallography that often achieves synchrotron quality data.
For biological SAXS the compact, high-performance NANOSTAR system is the best possible solution for satisfying the rapidly growing demands for SAXS data to be quantitatively combined with structural data from other techniques such as crystallography, NMR, or molecular dynamics.
The dual-port configuration can be implemented with a single end station, which gives you the flexibility to easily upgrade your capabilities. Even if you don’t need a second port right now, your future needs may change.
DIFFRAC.SUITE™ offers a wide range of software modules for easy X-ray powder diffraction data acquisition and evaluation. Based on Microsoft's .NET technology, DIFFRAC.SUITE offers all the advantages of modern software technology for stability, maximum ease of use and networking.
The fully customizable user-interface is characterized by a plug-in framework, providing a common look, feel and operation. All measurement and evaluation software modules can be operated as individual applications or integrated together in DIFFRAC.SUITE's plug-in framework. Unlimited networking allows access and control of any number of D2 PHASER, D8 ADVANCE, D8 DISCOVER and D8 ENDEAVOR diffractometers within a customer's network.
WIZARD – Method planning
COMMANDER – Method execution and direct measurements
TOOLS – Service Interface
Powder Diffraction Software:
DQUANT – Quantitative phase analysis
EVA – Phase identification and quantitative phase analysis
TOPAS – Profile analysis, quantitative analysis, structure analysis
Materials Research Software:
SAXS – Small Angle X-ray Scattering software
XRR – Comprehensive X-ray reflectometry analysis
TEXTURE – All-round Texture analysis meets ease-of-use
LEPTOS – Thin film analysis/Residual stress investigation
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