The EIGER2 is an easy-to-use, multi-mode (0D/ 1D/ 2D) detector for the D8 ADVANCE and D8 DISCOVER diffractometer families.
The Hybrid Photon Counting (HPC) detector is based on the 2nd generation of Dectris’ revolutionary synchrotron-proven EIGER technology. The large 2D area with over 500,000 pixels at 75x75µm2 allows for wide coverage with fine resolution. Dual energy thresholds and a high dynamic range enable accurate measurement of weak and strong signals alike. Bruker’s complete and seamless integration of the EIGER2 in the DIFFRAC.SUITE architecture, the ergonomic design of the detector mount and dedicated accessories result in a powerful and easy-to use solution.
Users can take full advantage of the impressive detector features for a wide range of measurement methods ranging from powder diffraction to materials research applications. Not a typical jack of all trades, the EIGER2 is a master of all applications: The high dynamic range, large 1D opening and over 500,000 pixels enable absorber free measurements, ultra-fast data collection for powder diffraction or reciprocal space maps, and a large 2D coverage for SAXS, texture and microdiffraction experiments.
The EIGER2 is seamlessly integrated into the DIFFRAC.SUITE architecture: 0D, 1D and 2D data acquisition modes are implemented consistently with step, continuous and advanced measurement types. Best data quality is ensured by our patented algorithms that deliver distortion free 2D scanning data without smearing.
The EIGER2 supports every data collection strategy efficiently and allows users to obtain best diffraction data for every sample type:
Whether you need large 2θ-coverage for fast powder diffraction snapshots or a wide γ-range for texture measurements, whether you want to capture a large part of the diffracted beam for SAXS/WAXS or need high angular resolution to separate closely spaced peaks - with the EIGER2 it takes only moments to optimize the instrument set-up.
The ingenious design of the Universal Detector Mount Plus enables tool-free changing of detector orientation and sample-to-detector distance for rapid switching between different applications, without having to compromise on data quality:
Panoramic, tool-free diffracted beam optics using the complete detector field of view were specifically designed for the EIGER2. The optics are magnetically mounted and equipped with real-time DAVINCI component recognition. These accessories complement the EIGER2 detection solution by minimizing parasitic scattering or other adverse effects such as smearing of the diffraction rings in 0D and 1D mode.
Available accessories include:
Specification |
Benefit |
|
Active Area |
77.2 x 38.6 = 2,978 mm² |
Large field of view with tuneable γ- and 2θ-coverage |
Pixels |
1,030 x 514 = 529,420 |
Excellent spatial resolution across the active area |
Pixel size |
75 x 75 μm² |
Balance resolution and count rate Minimize charge-sharing |
Max. count rate |
3.6 x 10⁸ ph/s/mm² |
Perfect for high dynamic range measurements, such as XRR and HRXRD, without the need for absorbers |
Dynamic Range |
> 10⁹ ph/s/mm² |
Maximum sensitivity for best 2D data quality |
Discriminators |
2, lower and upper threshold |
Improved signal-to-background through reduction of fluorescent and cosmic radiation |
Technology |
2nd generation EIGER technology, Hybrid Photon Counting |
Fast conversion of photon for highest count rates and dynamic range |
Wavelengths |
Cr, Co, Cu, Mo and Ag (5 keV – 23 keV) Synchrotron proven radiation stability |
One detector for all common wavelengths No damage by direct beam |
Sensor thickness |
450 μm |
> 99% Cr, Co, Cu; 50% Mo; 30% Ag sensor efficiencey |
Scan modes |
0D, 1D and 2D step and continuous scans 1D and 2D Snap-Shot and advanced scan modes |
Comprehensive and unified 0D/1D/2D scan implementation Flexible ROI selection along γ- and 2θ in all modes Distortion-free 2D data algorithms (patent pending) |
Operating Media |
None |
No maintenance and no additional cost for consumables Media-free design ensures long detector life without routing maintenance |
Applications |
XRR, HRXRD; Phase Identification, quantification, Structure refinement, residual stress, texture, micro-mapping, 2D diffraction |
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