WDXRF for Grade Control

Wavelength dispersive X-ray fluorescence spectrometers (WDXRF) provides superior analytical accuracy and precision in grade control laboratories. Like EDXRF all elements are excited by an X-Ray source in a WDXRF. Unlike a EDXRF the resulting secondary x-rays are diffracted in different directions and measured either sequentially or by a series of detectors for each element. This wavelength diffraction allows for high spectral resolution and the elimination of overlaps. For mineral grade control this can provide lower limits of detection in complex ores. Some advantages of WDRFD for grade control:

  • Provide highly precise results for mineral analysis when low-variance measurements are required or analyze trace elements where a low detection limit is required 
  • Accurate measurement of elements with complex overlaps, such as arsenic, lead, and gold. 
  • Meet strict ISO requirements such as ISO 9516-1:2003 for the measurement of iron, silicon, calcium, manganese, aluminum, titanium, magnesium, phosphorus, sulfur, potassium, tin, vanadium, chromium, cobalt, nickel, copper, zinc, arsenic, lead and barium in iron ores. 
  • Meet the requirements of high repeatability analysis.