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Microscopy & Microanalysis 2020

Virtual Event, Actual Science

Join Bruker online at Microscopy & Microanalysis Virtual Meeting from August 4-7, 2020. This year’s virtual format expands the opportunity for attendees from all around the world to have access to a variety of live and on-demand sessions. Join your scientific peers at the premier annual educational event that brings together the fields of microscopy and microanalysis.

Jump to: Bruker Technologies at M&M  |  Presentation Schedule  |  Sponsorships  |  VIP List
 

M&M 2020 WEBSITE      PLAY PICK THE BEAKER GAME      CONTACT US

Stay tuned for additional updates!

Event Registration


Learn About These Bruker Technologies in Our Virtual Booth

Hysitron PicoIndenters

Hysitron PicoIndenters

Quantitative In-Situ Nanomechanics Inside Your SEM or TEM

Dimension FastScan

Dimension FastScan

Flagship AFM for Nanoscale Research

Vutara 352

Vutara 352

A Complete Solution for Single-Molecule Localization Microscopy

Luxendo Light-Sheet Microscopes

Light-Sheet Microscopy

Advanced Single Plane Illumination Microscopes

M4 Tornado Plus

M4 TORNADO PLUS

Micro-XRF Spectrometer Enabling the Detection and Analysis of the Entire Element Range

Electron Microscope Analyzers

Electron Microscope Analyzers

Providing Unique Range of Analysis Methods Electron Microscopes: EDS for SEM or TEM, WDS, EBSD and Micro-XRF

e-Flash XS

NEW e-Flash XS

Unique EBSD Detector Dedicated to the Affordable Part of the SEM Market

ESPRIT QUBE

ESPRIT QUBE

Advanced 3D Analysis of EBSD/EDS Data

AMICS Software

AMICS Software

Advanced Mineral Identification and Characterization System

SENTERRA II

SENTERRA II

The Next Level of Compact Raman Microscopy

LUMOS II

LUMOS II

FTIR Imaging Microscope

SKYSCAN 2214

SKYSCAN 2214

3D X-ray Microscopy at the Nanoscale


Bruker's Presentation Schedule

Exhibitor Spotlight Sessions

Tuesday, August 4

In-Situ Nanomechanical Testing of Superalloys at 1000°C using the Hysitron PI 88 SEM PicoIndenter
Presenters: Michael Berg, Eric Hintsala, Ph.D., and Sanjit Bhowmick, Ph.D., Bruker
Time: 3:00 PM to 3:30 PM CDT  |  Exhibitor Spotlight 5

View Abstract
 

Wednesday, August 5

Characterization of Functional Materials by Electrical AFM Techniques
Presenter: John Thornton, Bruker
Time: 1:30 PM to 2:00 PM CDT  |  Exhibitor Spotlight 11

View Abstract
 

Invited Talk

Thursday, August 6

Measuring Viscoelastic Master Curves at the Nanoscale in Polymer Composites
Presenter: Thomas Mueller, Ph.D., Bruker
Time: 10:00 AM to 11:15 AM CDT  |  Presentation Number: 764
 

Poster Presentations

Wednesday, August 5

Fast Infrared Imaging for the Early Detection of Cancer
Presenter: Thomas Tague, Ph.D., Bruker
Time: 3:30 PM to 5:00 PM CDT  |  Presentation Number: 513
 

Thursday, August 6

Definition of the Detection Limit in Energy-dispersive Spectrometry
Presenter: Ralf Terborg, Ph.D., Bruker
Time: 4:00 PM to 5:30 PM CDT  |  Presentation Number: 853

Correlated Post-mortem Raman and TEM Investigation of Nanoindentation Induced Structural Changes in Silicon as a Function of Temperature
Presenter: Eric Hintsala, Ph.D., Bruker
Time: 4:00 PM to 5:30 PM CDT  |  Presentation Number: 1049
 

Friday, August 7

High Speed SEM Elemental Mapping with Micro-XRF-EDS
Presenter: Stephan Boehm, Bruker
Time: 1:00 PM to 2:30 PM CDT  |  Presentation Number: 1061

Study of Extreme In-Situ Mechanics of Bond Coatings and Ni-based Superalloys Using an Advanced SEM Nanomechanical Instrument
Presenter: Sanjit Bhowmick, Ph.D., Bruker
Time: 1:00 PM to 2:30 PM CDT  |  Presentation Number: 1066


Bruker's Sponsorships at M&M 2020

Birds of a Feather Networking Rooms

Join us for an engaging two-hour networking session on our featured topic where you will have a chance to hear a few words from our Bruker experts before we open the floor up for discussion, with hopefully all of us taking something new away.

Tuesday, August 4

Exploring the intersection of Microscopy and in-situ Mechanics? Join Bruker's Hysitron experts for a virtual networking session to discuss your experience and learn about new developments!
Time: 12:00 PM to 2:00 PM CDT  |  Networking Room EE
Hosted by Dr. Douglas Stauffer

Wednesday, August 5

Bruker’s Element mapping on the nanoscale: Can we move forward combining existing solutions and knowledge from materials science and life science for advances in in-situ and cryo-EM?
Time: 11:00 AM to 1:00 PM CDT  |  Networking Room HH
Hosted by Dr. Meiken Falke

Could more affordable EDS and EBSD on SEM lead to faster advances in science and technology? Bruker thinks so, what do you think?
Time: 12:00 PM to 2:00 PM CDT  |  Networking Room JJ
Hosted by Dr. Daniel Goran

Interested in AFM Nanoscale Property Measurements? Have some ideas of your own? Join Bruker to share your experiences and learn best practices!
Time: 2:30 PM to 4:30 PM CDT  |  Networking Room JJ
Hosted by John Thornton

Symposia Sponsorships

A09 - Surface and Subsurface Microscopy and Microanalysis of Physical and Biological Specimens
Surface properties dictate the performance of many physical and biological systems. The surface analyst is asked to detect and image species present in ever-lower concentrations and within ever-smaller spatial and depth dimensions. This symposium emphasizes state-of-the-art surface analytical instrumentation encompassing all aspects of surface and near-surface analyses, such as mass spectrometry, scanning probe microscopy and other probe-based techniques. We will cover advanced data analysis tools; correlative imaging (e.g., AFM and SEM; AFM and SIMS; FIB-SIMS); the use of complementary surface instrumentation to perform a complete analysis of complex systems; quantitative microanalysis; data processing; and surface analytical challenges. Both platform and poster presentations are encouraged.

Invited speakers include Dr. Thomas Mueller
 

B03 - Methods and Applications in Localization-Based Super-Resolution Microscopy
Single molecule localization microscopy (SMLM) utilizes a large sequence of sparse, single molecule fluorescence images to achieve super resolution via estimating the location of many individual fluorophores within a sample. The final 'image' is a graph of the collection of these location estimates. Many probe labeling strategies, both genetic and organic, are now available that provide bright fluorescence as well as the requisite sparse activation. Creative hardware designs based on point-spread function engineering or interferometry can achieve different degrees of axial (z) localization precision as well as different imaging depths, depending on experimental requirements. Using appropriate dyes, image processing algorithms, and system design, sub-20 nm localization precision in x, y, and z can be routinely achieved. This high-localization precision, along with single-molecule sensitivity, has enabled a wide range of biological imaging applications such as sub-diffraction single molecule tracking, very high resolution (50-100 nm) imaging of multiple targets, and even structural reconstructions of macromolecular complexes (<10 nm) where particle averaging is applicable. Methods for fusing SMLM images with other imaging modalities are beginning to emerge.
 

P06 - In situ TEM at the Extremes
In situ TEM provides unique information about the response of materials under extreme conditions, including extreme environments and/or at extreme spatiotemporal resolution. For example, the degradation of materials under extreme environments (i.e., high temperature, corrosion, mechanical deformation and radiation damage etc.) can be investigated at high resolution with specialized holders or microscope systems. Or, the observation of materials that only exist at conditions far from room temperature. Often, extreme timescales are needed to capture transient events or reversible phenomena. This symposium invites contributions from all in situ TEM experiments that contribute to the methodology development or the understanding of materials at extreme conditions.


Join the VIP List

Get early updates and last minute tricks and tips in the coming days before M&M. There is still room for you on our VIP list.
 

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