Two Complementary Nanoscale IR Techniques: Photothermal AFM-IR and s-SNOM
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This webinar introduces two main techniques for nanoscale IR measurements: Photothermal AFM-IR (PTIR/AFM-IR) and IR-based Scattering Scanning Nearfield Optical Microscopy (IR s-SNOM). Both complementary modes are combined within a single instrument: Bruker’s nanoIR3-s setup. Starting with a theoretical introduction into basic principles of both techniques, this session provides an overview of key applications and basic system configuration in our demo lab in Santa Barbara, CA (US).