Investigating Nanoscale Properties with Atomic Force Microscopy
Latest Advances, Applications, and Best Practices
A workshop co-hosted by Vanderbilt University and Bruker
August 18 - 19, 2026 | 9:00 AM - 5:00 PM CDT
Explore New Advances and Research Trends
Bruker co-hosted an atomic force microscopy workshop in collaboration with Vanderbilt University on August 18-19. During this free event, we discussed new research trends leveraging unique AFM modes and techniques.
Free hands-on demonstrations were also be performed with Bruker’s Dimension Icon AFM.
We hope you enjoyed the workshop and gained valuable knowledge and practical insights to support your research. If you have any questions, please contact Dr. Rick Kitadai at hikari.kitadai@bruker.com.
Location:
Vanderbilt University
Engineering and Science Building
1212 25th Avenue South, Room 001
Nashville, TN 37212
Workshop Organizers
Dmitry Koktysh, Ph.D.
Lab Supervisor, VINSE Analytical Laboratory
dmitry.koktysh@vanderbilt.edu
Sarah Ross
Senior Program Manager at VINSE
sarah.m.ross@vanderbilt.edu
Rick Kitadai, Ph.D.
Regional Sales Engineer, Bruker
hikari.kitadai@bruker.com
Meet Our Experts
John Thornton,
Senior Applications Scientist, BrukerJohn Thornton is a Senior Applications Engineer at Bruker Nano Surfaces with 25+ years of experience in the field of Atomic Force Microscopy (AFM). He learned AFM at North Carolina State University in the 1990s, and then joined Digital Instruments, a pioneering company in early AFM development, and continued with the company through acquisitions by Veeco Instruments, and then Bruker. John has co-authored many scientific publications and developed scanning probe microscopy training courses. Currently, John spends a significant amount of time running AFMs and educating others on techniques. He currently works from his home in Virginia, and from the Bruker AFM applications lab in Billerica, MA.
Agenda – Tuesday, August 18
| 9:00 AM | Registration |
| 9:15 AM | Opening: Vanderbilt/Bruker Welcome |
| 9:30 AM | Bruker Presentation I – Atomic Force Microscope: Working Principles |
| 10:30 AM | Coffee Break |
| 10:45 AM | Bruker Presentation II – Advanced AFM Techniques and Recent Developments (Material Science Focus) |
| 11:45 AM | Lunch (provided by Bruker) |
| 1:00 PM | AFM Lab (PeakForce Tapping, PeakForce QNM, Phase Imaging, Conductive AFM) |
| 5:00 PM | End of Day 1 |
Agenda – Wednesday, August 19
| 9:00 AM | Bruker Presentation III – Optical Profilometry Talk |
| 10:00 AM | Coffee Break |
| 10:15 AM | Bruker Presentation IV – AFM Fluid Imaging Overview, Best Practices |
| 11:00 AM | Data Analysis, Q/A Discussion |
| 11:30 AM | Lunch (provided by Bruker) |
| 1:00 PM | AFM Lab (Fluid Imaging, Force Spectroscopy) |
| 5:00 PM | End of Event |
