EDS Webinar

The Future of EDS Starts Here - Introducing inclined 4-Channel Detection

Tuesday, 27 October 2026

Session I: 10:00 CET (Berlin), 17:00 SGT (Singapore), 18:00 JST (Tokyo)

Session II: 12:00 EDT (New York), 13:00 BRT (São Paulo), 17:00 CET (Berlin)

^{Both sessions cover the same content.}

Meet XFlash® 7200 FIRE, The New Hero of Elemental Analysis on SEM

XFlash® 7200 FIRE, Bruker's pioneering new EDS detector, introduces a fundamentally new approach to high-performance X-ray analysis in SEM. Built on Bruker’s four-segment integrated detector technology, XFlash® 7200 FIRE delivers at the same time exceptional throughput, outstanding energy resolution, and unmatched sensitivity without the compromises traditionally associated with large-area detectors.

In this webinar, learn how QUANTX EDS with XFlash® 7200 FIRE enables faster access to critical analytical insights, improves the determination of any sample composition, and enhances productivity across a wide range of applications. Discover how this next-generation technology empowers researchers and engineers to tackle increasingly complex materials challenges in semiconductor inspection, battery analysis, advanced manufacturing, life sciences, and beyond.

Register now to secure your spot and discover the new generation inclined Energy Dispersive X-ray Spectroscopy (EDS) detector engineered for ultra-fast, high-resolution elemental analysis on the SEM.

Ultra-low-kV SEM-EDS analysis of the diatom Stephanopyxis turrisusing the XFlash® 7200 FIRE. High collection efficiency and exceptional sensitivity to ultra-low-energy X-rays enabled elemental mapping at 1.7 kV and 1.6 nA probe current, giving an output count rate of 19,200 cps at only 1% dead time. At 1.7 kV, Si Kα is not excited, allowing chemical mapping of the nanostructured silica frustule exclusively through the Si L emission line (91 eV). The combination of low-kV excitation, high count statistics, and low electron dose enhances spatial resolution while minimizing specimen drift and beam-induced damage in this beam-sensitive biological sample.

Speakers

Dr. Purvesh Soni

Sr. Applications Scientist EDS, Bruker Electron Microscope Analyzers

Dr. Sebastian Schmidt

Product Manager EDS, Bruker Electron Microscope Analyzers