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Brochures and Data Sheets

• Dimension XR Scanning Probe Microscopes Brochure 2.5MB
Extreme Research Systems for Nanomechanics, Nanoelectrical, and Nanelectrochemistry

• PeakForce Tapping Brochure 2.7MB

Bruker’s exclusive PeakForce Tapping® is the most significant scientific breakthrough in atomic force microscope (AFM) technology since the introduction of TappingMode™. It provides unprecedented high resolution imaging, extends AFM measurements into a range of samples not previously accessed and uniquely enables simultaneous nanoscale property mapping.

PeakForce SECM - Brochure 1.64MB

Bruker’s exclusive PeakForce SECM™ mode is the world’s first complete commercial solution for AFM-based scanning electrochemical microscopy (SECM). With a spatial resolution less than 100 nanometers, PeakForce SECM™ uniquely provides simultaneous capture of topographical, electrochemical, electrical, and mechanical maps with nanoscale lateral resolution.

Application Notes

• Quantitative Mechanical Property Mapping at the Nanoscale with PeakForce QNM - AN128 1.3MB

This application note discusses the principles and benefits of the PeakForce QNM imaging mode.

Quantitative Measurements of Elastic and Viscoelastic Properties with FASTForce Volume CR - AN148 3.3MB

Contact resonance captures both elastic and viscoelastic properties including storage modulus, loss modulus, and loss tangent for materials from soft polymers to metals. FASTForce Volume CR uniquely exploits AC force volume mapping to offer over 15 different mechanical data channels including adhesion without tip wear or sample damage.

Improving the Accuracy of Nanomechanical Measurements with Force-Curve-Based AFM Techniques - AN149 2.8MB

This application note discusses the development and implementation of several new features that improve the flexibility, accuracy, and productivity of atomic force microscopes (AFMs) in measuring such important material properties as modulus and adhesion.