software, X-ray diffraction, DIFFRAC.SUITE

EVA Software - The next era in phase analysis

DIFFRAC.EVA defines a new benchmark for phase analysis by making interpretation of one- and two-dimensional XRD data easier, faster, and more accurate than ever. Most remarkable is EVA’s complete collection of the best algorithms for data integration and evaluation, blended with a new and innovative design and operation concept for maximum simplicity and flexibility.

New Features in V5 !

General data evaluation options

EVA provides a complete collection of the best algorithms for XRD data analysis with full access to all function parameters. Seeing is believing - thanks to a unique Real-Time-Preview of all evaluations for visual validation, thus guaranteeing most reliable and accurate results.


Reversing an action? No problem! EVA allows to undo and redo all operations. EVA is the tool of choice for basic data evaluation such as crystallinity and crystallite size determination.

Reliable and accurate phase analysis

Since its first release, EVA's search/match module is generally appreciated as the most reliable and most accurate tool for phase identification.

Correspondingly, EVA performed best in an international Search-Match Round Robin (Le Meins et al., 2002, Since then numerous improvements have further differentiated EVA from conventional software for phase analysis:

  • Highly sophisticated residual search with respect to already identified phases, thus greatly improving analysis of minor phases
  • Support of Variable Counting Time (VCT) and Dynamic Beam Optimization (DBO) data for highly accurate trace phase analysis thanks to significantly decreased Lower Limits of Detection (LLoD)
  • Simultaneous search in multiple reference databases, such as the ICDD PDF2/PDF4+/PDF4 Minerals/PDF4 Organics databases
  • Grouping of candidate patterns phases to handle the ever-increasing number of similar or nearly identical reference database entries
  • Phase identification and accurate quantitative phase analysis based on RIR (reference intensity ratios) values


For more information on this topic see the DIFFRAC.EVA V3 flyer.

Easy to use from the very beginning

EVA also delivers features for user-interface, graphics and analysis report customization never seen before. Furthermore, EVA represents a professional graphing and reporting system for creation of cutting edge, publication-ready graphics and analysis reports.


An extensive step-by-step tutorial makes EVA easy to use from the very beginning. The tutorial also serves as an excellent teaching tool to introduce newcomers to XRD analysis, getting them started with ease in the shortest time possible.

Cluster analysis to handle large amounts of data

Cluster analysis in EVA provides deeper understanding and intuitive presentations of large amounts of X-ray data.

The cluser analysis tool is an adaption of the well-known Polysnap software. It assists in the identification of known and unknown samples, analyzes mixtures, outliers, and assists in quality control. It is used for high-thoughput screening but also for analyzing non-ambient data.

For the new features please refer to the DIFFRAC.EVA V4 flyer.

EVA Software - Features

General data evaluation options:

  • Peak search and creation of peak data, e.g. for phase identification
  • Manual and fully automatic background subtraction
  • Data smoothing (Savitzky-Golay method or Fourier filtering)
  • Kα2-stripping (enhanced Rachinger method)
  • 2theta-offset and sample displacement corrections
  • Calculation of mass absorption coefficients and corresponding X-ray penetration depth into the specimen
  • Calculation of profile parameters such as line position, center of gravity, integrated area, half width and more
  • Analytical profile fit for single peaks and patterns
  • Crystallite size determination (Scherrer method)
  • Addition, subtraction, scaling, normalisation and merging of scans
  • Simultaneous evaluation of multiple scans
  • Undo / redo of all operations

Cluster analysis

  • Combine up to four XRD datasets
  • Automatic Weighting Scheme
  • Five clustering methods
  • Cluster Validation Tools
  • Customisable Analysis Methods
  • Re-run selected analysis
  • Interactive Dendrograms
  • Cell view
  • 3D MMDS and PCA plots
  • 6D plots of sample prep info
  • Numerical Results
  • Amorphous Phases Identification
  • Reference patterns for mixtures
  • Quality Control mode
  • Report Writer
  • Online documentation, Program Tutorial
  • SQUALL: semi-quantitative analysis based on reference scans
  • For more details see: Polysnap Features

Data exchange and reporting options:

  • Creation of customizable, high quality analysis reports
  • Data exchange options to and from any other Windows application: copy and paste, Windows bitmaps and metafiles
  • Display and printout of all reference database patterns
  • Data can be exported as Bruker’s .raw file format, an ASCII 2 column XY file or a 3 column XYE file
  • Connection to instrument database for multi-sample reporting of scan, peak and pattern properties via DIFFRAC.SUITE RESULTS-MANAGER

Advanced XRD2 data evaluation and display options

  • Single 2-D frame integration over gamma and 2Theta with full frame, wedge, ring and line cursor
  • Integration on merged 2-D frames with slice, wedge und ring cursor
  • Multiple integrations on stackable 2-D frames with one click
  • User configurable masks with angular or pixel coordinates
  • “Rocking curve analysis” on stackable 2-D frames with various frame properties
  • Frames are automatically grouped into mergeable or stackable lists
  • For large zoom factors the 2-D view displays the number of counts inside the pixel areas

Data display options:

  • Self explaining user interface, fully customizable by each individual user
  • Advanced picture-in-picture (PIP) and vertical-in-place (VIP) zoom options
  • Customizable 2-D and 3-D data representations (iso-intensity plots, waterfall plots)
  • Free customization of graphics and text properties for creation of publication-ready figures
  • Bragg 2D: Two-dimensional visualization of sample inhomogeneities (large crystallites, preferred orientation), measured with a 1-dimensional detector

Phase identification and quantitative phase analysis options:

  • Supports ICDD PDF2, ICDD PDF4 plus and PDF4 AXIOM, and the COD reference databases
  • Simultaneous search in multiple reference databases
  • Search on full-pattern and peak data
  • Search for solid solutions and isostructural phases
  • Highly sophisticated residual search
  • Match peaks support identification of minor phases
  • Wavelength cursor for interactive identification of spectral abberations (tungsten, Kß lines)
  • Consideration of 2theta-offset and sample displacement errors
  • Search by various selection criteria such as chemical composition, card quality marks, subfiles, and more
  • Graphical adjustment of peak positions via tuning of lattice parameters e.g. to describe solid solutions
  • Hkl-generator for calculating peak positions based on lattice parameters and space group to aid identification of missing or redundant specimen peaks
  • Interactive overlay of the search results with the measurement data for easy evaluation
  • Display of stick patterns as well as „Rietveld-type“ tick marks with hkl-indices, if available
  • Quantitative analysis based on RIR (reference intensity ratio) and spiking methods
  • Degree of crystallinity determination
  • „Combined XRD-XRF analysis“: Validation and improvement of search as well as quantitative phase analyses results using elemental analysis results; direct access to SPECTRAplus XRF databases, formatted ASCII-files, and more
  • Support of variable counting time data


  • 21 CFR Part 11

Multilanguage support

  • Chinese, English, French, German, Japanese

DIFFRAC.EVA - New benchmark for phase analysis

Phase Analysis

Since its first release, EVA's search/match module is generally appreciated as the most reliable and most accurate tool for phase identification. 

Evaluation Options

EVA provides a complete collection of the best algorithms for XRD data analysis with full access to all function parameters.

Cluster Analysis

High power X-ray sources, fast detectors, automated sample changer ... and more data in shorter time. To keep the overview over all those data, cluster analysis has been added to EVA.

  • Todas
  • Evaluation Option
  • Phase Analysis
  • New features in V5
  • Cluster Analysis

Keep your DIFFRAC.EVA current

Free Maintenance Update

The free DIFFRAC.EVA Maintenance Update renews your EVA version to the most recent release and provides compatibility with the actual releases of ICDD PDF 2, PDF 4+, PDF 4 Minerals, and PDF 4/Organics databases, if required. The new ICDD PDF4 AXIOM database is supported from Version 5.

Regardless of your EVA version, you can always download the latest Maintenance Update from, free-of-charge! Furthermore, you may check for an update of our courtesy version of the COD database for phase identification.


By keeping your DIFFRAC.EVA current, you will benefit from all bugfixes made for the current but also all previously released versions. DIFFRAC.EVA Maintenance Updates are cumulative and can therefore be applied to any previous DIFFRAC.EVA version.


The current version of the software is DIFFRAC.EVA V5.2. The actual COD search database has been compiled in January 2019.

What are Updates?

DIFFRAC.EVA Maintenance Updates do not come with new features. If you want to benefit from the many exciting new features introduced in each new EVA version you need to purchase the latest DIFFRAC.EVA upgrade.

Download process

  • Register at Bruker Customer Support
  • Click on the "Software" button
  • Search for the DIFFRAC.EVA Maintenance Update
  • Download the update