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AFM Webinars

An Open and Free Resource for Atomic Force Microscope Owners and Users

Our atomic force microscopy webinars are available on our YouTube channel — www.youtube.com/BrukerNanoSurfaces. The links below will take you to the respective recording online. No registration is needed to watch a prior webinar. Sign up for email notifications about Bruker's upcoming webinars.

Recent Webinars

Title Content Link Date
Nanoelectrode Probe for Scanning Nanoelectrochemistry and Nanoelectrical Liquid Imaging In situ, multimodal, nanoscale imaging is highly desired for today’s multidisciplinary research, e.g. energy, material and biological studies. Bruker recently developed batch-fabricated, robust nanoelectrode probes that have an exposed, active Pt tip apex of ~250 nm height and an end tip radius of ~25 nm. These probes are used in PeakForce Scanning Electrochemical Microscopy (PeakForce SECM) for simultaneous capture of topography, conductivity, and quantitative nanomechanical information at the nanoscale, and electrochemical properties at sub-100 nm resolution. Bruker also developed Force Volume SECM providing improved electrochemical kinetic quantification, 3-D nano-electrochemical and nanomechanical mapping. The nanoelectrode probe - by design - also enables nanoelectrical measurements in liquid, in particular PeakForce-TUNA, PeakForce-KPFM and PFM. In this talk, Dr. Huang will introduce these unique techniques with a variety of applications examples related to today’s highly multidisciplinary research.
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Nov 2017

NanoIndentation, Scratch and nanoDMA Innovations for Atomic Force Microscopes - US BROADCAST The TriboScope seamlessly interfaces with Atomic Force Microscopes to deliver quantitative and repeatable mechanical and tribological characterization over the nanometer-to-micrometer length scales. By utilizing a rigid test probe, the TriboScope enables static and dynamic instrumented indentation. This webinar will discuss nanomechanical properties are obtained via AFM based nanoindentation comparing rigid probe vs cantilever based measurements. We will explore true force and displacement feedback control modes and cover applications from soft polymers to hard ceramics. Additionally, we will review nano-scratch, nano-wear and nanoDMA techniques and applications.
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Sept 2017

NanoIndentation, Scratch and NanoDMA Innovations for Atomic Force Microscopes The TriboScope seamlessly interfaces with Atomic Force Microscopes to deliver quantitative and repeatable mechanical and tribological characterization over the nanometer-to-micrometer length scales. By utilizing a rigid test probe, the TriboScope enables static and dynamic instrumented indentation. This webinar will discuss nanomechanical properties are obtained via AFM based nanoindentation comparing rigid probe vs cantilever based measurements. We will explore true force and displacement feedback control modes and cover applications from soft polymers to hard ceramics. Additionally, we will review nano-scratch, nano-wear and nanoDMA techniques and applications.
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July 2017
Technology Advances in Nanomechanics With guest presenters:
The quest for nanomechanical measurements with AFM: Are we there yet? by Dalia Yablon, Ph.D. - SurfaceChar LLC.
Due to the inherently mechanical tip-sample contact, AFM is primed to make long-sought measurements of mechanical properties such as modulus, adhesion, and dynamic moduli on the nanoscale. But are we there yet? Can we say today that AFM can truly perform accurate, quantitative nanomechanical measurements? There has been significant progress since the early days of force volume and phase imaging measurements. Progress will be discussed in two specific categories of nanomechanical measurements: contact resonance and force spectroscopy. Though both techniques have existed for a long time, recent significant improvements in both hardware and software capabilities reveal promising results in the quest for accurate and quantitative measurements. Progress in these capabilities will be discussed with application to polymeric materials in addition to limitations and uncertainties that still need to be addressed.
Improving the accuracy of AFM-based nanomechanical measurements by Bede Pittenger, Ph.D. - Bruker Nano Surfaces
The morphology and mechanical properties of sub-micron features in materials are of interest due to their influence on macroscopic material performance and function. Atomic Force Microscopy has the high resolution and force control to directly probe the mechanical properties of a wide range of these materials. Over the past two decades, several AFM based methods have evolved to allow this sort of mechanical mapping, each with specific strengths. While qualitative maps have long been available, much progress has been made toward increasing the repeatability and accuracy of the mechanical property maps. Expanded modeling, better calibration, and more optimal probe design have all contributed, resulting in improved ease-of-use and accuracy. This presentation will review this recent progress, providing examples that demonstrate the dynamic range of the measurements, their repeatability, and the speed and resolution with which they were obtained. Examples cover the range from very soft biomaterials and cells, through polymer blends and composites, to metals and ceramics.
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June 2017

Topic: Nanospectroscopy

Title Content link Date
Investigating 2D Materials with AFM: Five Recent Nature Publications Graphene and other 2D materials and heterostructures have been of great interest recently largely because of their unique mechanical, electrical, and optical properties. Atomic force microscopy (AFM) modes such as PeakForce QNM, KPFM, and PeakForce IR can provide the multiparametric mapping capability to investigate the properties of these materials with resolution down to the level of single atoms. In this webinar we will discuss the application of AFM to 2D materials and review five recent Nature publications that use AFM to discover new properties or phenomena. Download

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July 2015
Nanoscale Chemical Identification for Materials Science and Biomolecular Imaging Due to their unique absorption fingerprint, many materials can be conveniently characterized in the infrared spectral region. However, diffraction limits the spatial resolution to several microns. Here we present the Bruker Inspire with PeakForce IR, an integrated nanocharacterization tool that enables straightforward nanoscale infrared absorption and reflection imaging while simultaneously accessing nanomechanical and -electrical information with molecular resolution.

We will show new results in biomolecular, polymer, and graphene plasmon imaging, and explain the complete workflow for obtaining these new kinds of high-resolution correlated data.
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June 2015
Delivering the Highest Resolution Nanochemical and Property Mapping In this webinar we introduce the new Bruker Inspire system, which leverages PeakForce Tapping™ and integrated scattering scanning near-field optical microscopy (sSNOM) optics to combine the best of AFM with nanoscale IR chemical mapping. Inspire is the first integrated sSNOM system with Bruker’s proprietary ScanAsyst®. For the first time, chemical and quantitative nanomechanical maps are acquired concurrently, at highest spatial resolution. With IR optical at 10nm lateral resolution and monolayer sensitivity, revealing chemistry, material type, and plasmonics, Inspire opens the door to a whole range of new nanoscale science.
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Aug 2014
Beating the Diffraction Limit by 1000x An introduction to nanoscale IR imaging with applications in graphene

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Jun 2013

Topic: Nanoelectrical

Title Content link Date
New Electrical Measurements for Materials Research and Semiconductors with guest speaker Dr. Oskar Amster from PrimeNano Inc.
In this joint webinar with PrimeNano Inc, we will introduce new nanoscale electrical measurements available exclusively on Bruker’s Dimension Icon platform. Bruker’s recent introduction of PeakForce Tapping based variants of electrical measurements has greatly expanded the utility of these techniques, enabling for example previously impossible conductivity measurements on fragile samples with PeakForce TUNA. Today we introduce the ScanWaveTM module with scanning Microwave Impedance Microscopy (sMIM) on Bruker’s Dimension Icon. sMIM allows for the direct imaging of local electrical properties (permittivity and conductivity) and carrier profiling with a < 30 nm lateral resolution. Its exclusive integration with PeakForce Tapping technology not only affords the simultaneous mapping of mechanical properties but also extends the sample range beyond the constraints of contact and Tapping Mode, providing vastly expanded flexibility.
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November 2015
AFM-based Conductivity Measurements Bruker AFM representatives highlight common Issues in AFM based Conductivity measurements, and offer solutions to ensure the best possible results.

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September 2015
Ultra-High Resolution Nanoelectrical Measurements for Semiconductor Applications In this joint IMEC - Bruker webinar we showcase new electrical measurements on semiconductor and organic photovoltaic samples enabled by the Dimension Icon glove box solution. We are going to present carrier profiling results at the level of spatial resolution and repeatability that was previously thought to be attainable only in high vacuum.
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December 2014
Mapping Graphene's Surface Potential with <20nm Resolution A PeakForce KPFM study in a controlled <1ppm water and oxygen environment
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Sep 2013

Topic: Nanomechanical

Title Content Link Date
Technology Advances in Nanomechanics With guest presenters:
The quest for nanomechanical measurements with AFM: Are we there yet? by Dalia Yablon, Ph.D. - SurfaceChar LLC.
Due to the inherently mechanical tip-sample contact, AFM is primed to make long-sought measurements of mechanical properties such as modulus, adhesion, and dynamic moduli on the nanoscale. But are we there yet? Can we say today that AFM can truly perform accurate, quantitative nanomechanical measurements? There has been significant progress since the early days of force volume and phase imaging measurements. Progress will be discussed in two specific categories of nanomechanical measurements: contact resonance and force spectroscopy. Though both techniques have existed for a long time, recent significant improvements in both hardware and software capabilities reveal promising results in the quest for accurate and quantitative measurements. Progress in these capabilities will be discussed with application to polymeric materials in addition to limitations and uncertainties that still need to be addressed.
Improving the accuracy of AFM-based nanomechanical measurements by Bede Pittenger, Ph.D. - Bruker Nano Surfaces
The morphology and mechanical properties of sub-micron features in materials are of interest due to their influence on macroscopic material performance and function. Atomic Force Microscopy has the high resolution and force control to directly probe the mechanical properties of a wide range of these materials. Over the past two decades, several AFM based methods have evolved to allow this sort of mechanical mapping, each with specific strengths. While qualitative maps have long been available, much progress has been made toward increasing the repeatability and accuracy of the mechanical property maps. Expanded modeling, better calibration, and more optimal probe design have all contributed, resulting in improved ease-of-use and accuracy. This presentation will review this recent progress, providing examples that demonstrate the dynamic range of the measurements, their repeatability, and the speed and resolution with which they were obtained. Examples cover the range from very soft biomaterials and cells, through polymer blends and composites, to metals and ceramics.
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June 2017
Defect Classification by AFM-Based Nanomechanical Measurement High Resolution, In Situ Materials Classification Enabled by PeakForce Tapping
This webinar discusses our latest research to address fast, in-line characterization of defects, one of the most serious problems facing semiconductor process yield and control in-coming process nodes.

Working together, SEMATECH and Bruker have developed a new and innovative method of obtaining defect material classification information on very small defects, in-situ, leveraging the repeatable, high resolution materials property characterization uniquely enabled by PeakForce Quantitative Nanomechanical Mapping (PeakForce QNM®).
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Sept 2014
Nanoscale Mechanical Property Measurements in AFM Modes with Direct Force Control with guest speaker: Gheorghe Stan from NIST
In this talk, we will discuss improvements to the contact geometry analysis for CR-AFM with examples on various materials. We will also examine new developments combining CR-AFM with force-controlled modes such as force volume and PeakForce tapping. This provides new insights for contact mechanics and also into the mechanics of contact formation and contact breaking. Finally, we will consider the effect of the time dependence of material properties on all of the measurements.
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July 2014
Advances in AFM Nanomechanics We describe the high resolution mechanical property mapping capabilities of PeakForce QNM and Force Volume and discuss the benefits of co-located measurements with other techniques such as Kelvin Probe Force Microscopy (KPFM) and Raman
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Feb 2013

Topic: Biological

Title Content Link Date
High-Resolution Imaging and Nanomechanical Mapping of Virus Binding Sites to Animal Cells Currently, there is a growing need for methods that can quantify and map the molecular interactions of biological samples, both with high-force sensitivity and high spatial resolution. Force-distance (FD) curve-based atomic force microscopy is a valuable tool to simultaneously contour the surface and map the biophysical properties of biological samples at the nanoscale. In this webinar, we will report the use of advanced FD-based technology combined with chemically functionalized tips to probe the localization and interactions of chemical and biological sites on single native proteins and on living cells at high-resolution. I will present how an atomic force and confocal microscopy set-up allows the surface receptor landscape of cells to be imaged and the virus binding events within the first millisecond of contact with the cell to be mapped at high resolution (<50 nm). I will also highlight theoretical approaches to contour the free-energy landscape of early binding events between an engineered virus and cell surface receptors. Owing to its key capabilities (quantitative mapping, resolution of a few nanometers, and true correlation with topography), this novel biochemically sensitive imaging technique is a powerful complement to other advanced AFM modes for quantitative, high-resolution bioimaging.
With guest presenters:
Prof. Dr. David Alsteens is now a head of a NanoBioPhysics group at Université Catholique de Louvain in Belgium. David has acquired his MSc. and PhD at the same University in the field of nanobiothechnology with Prof. Yves Dufrene. After that David did a PostDoc at Department of Biosystems Science and Engineering at ETH in Basel, Switzerland in the group of Daniel Mueller. David’s research focus at the moment on the NanoBioPhysics of the cell surface machinery. His team uses mainly use atomic force microscopy (AFM) to image at high-resolution single proteins, receptors, virus and cells. Furthermore, he uses force-distance curves based-AFM to probe molecular or cellular biophysical properties to quantify at the single-molecule level interactions that drive biological processes. David is the co-author of 55 publications and 7 books.
Dr. Andra Dumitru is a postdoctoral fellow in the group of David Alsteens at Université Catholique de Louvain in Belgium. Andra received her MSc. in Organic Chemistry from the Universidad Complutense de Madrid, Spain. She completed her PhD in Ricardo Garcia’s lab at the Institute of Materials Sciences in Madrid, where her main focus was applying single-molecule and single-cell force spectroscopy methods to biomedical sciences. Now as a postdoctoral fellow, Andra is interested in exploring membrane receptors and cell nanomechanics at high-resolution using force-distance curves-based AFM.
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Mar 2017
AFM in Cell Mechanics: Investigating the Nanomechanical Properties of Living Cells Cellular Mechanics is attracting an increasing interest in the biophysical and biomedical community. Two main reasons are: (1) the evidence is growing that cell mechanics is a marker of the state of a cell and consequently also the state of a disease at a cellular level, and (2) the availability of AFM allowing to measure quantitatively with high spatial resolution mechanics of cells, e.g. by force curves. Although cells are highly viscous, which is apparent in force curves by a large separation of loading and unloading curve, in most cases this is neglected during analysis of force data, since there is no simple and general way to consider it.

In this webinar, Manfred Radmacher, Professor of Biophysics at the University of Bremen Germany will present his latest research showing that the creep response of cells can be measured and analyzed quantitatively when applying a fast step in force or - alternatively - by changing the sample height. With the help of an adequate model sample viscoelastic properties can be derived quantitatively. The data obtained by AFM match whole cell data measured using pipette aspiration. Typical values of viscoelastic properties for adherent cells are elastic moduli around 1kPa, dynamic viscosities around 100 Pa, and relaxation times around 100ms. The latter will determine the timescale at which (whole cell) active processes like shape changes or migration can occur. Bruker Applications Scientists, Andrea Slade and Bede Pittenger, will also discuss the latest advances in Bruker’s Bioscope Resolve AFM, including the newly released Ramp Scripting, that are enabling these types of quantitative measurements of the nanomechanical properties of living cells.
Watch May 19
From Correlated, High-Resolution Imaging of Single Biomolecules to Investigating Cell Mechanics with guest speaker Dr. Hermann Schillers, University of Münster, Germany
The BioScope ResolveTM is Bruker’s latest advancement in atomic force microscopy (AFM) for biological research. Specifically designed to be integrated and synchronized with optical microscopy, including fluorescence, confocal microscopy, and super-resolution imaging, we will describe how the BioScope Resolve is providing new methods of studying cell mechanical properties and investigating the mechanisms involved in mechanotransduction. The high-resolution, three-dimensional imaging capabilities of the BioScope Resolve is also enabling routine visualization of a wide range of biomolecules, from the major and minor grooves of the DNA double helix to monolayers of living cells, under near-physiological conditions. In fact, we will present the first images of the very soft and flexible microvilli obtained on the membrane surface of living cells by AFM and discuss the observed force-dependency of these structures.
Watch June 2015
BioScope Resolve: The Most Advanced AFM for Life Science Research In this webinar, we introduce the significant advancements of the BioScope Resolve and how it enables researchers to routinely visualize nanoscale structures, such as microvilli, on the membrane surface of living cells; as well as obtain submolecular resolution of the DNA double helix and membrane proteins, such as bacteriorhodopsin.
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February 2015
High-resolution Imaging of Chemical and Biological Sites Using PeakForce QNM Atomic Force Microscopy with guest speaker: David Alsteens & Moritz Pfreundschuh from ETH Zurich
In this webinar, we will discuss the use of Bruker's advanced FD-based technology, PeakForce QNM®, combined with chemically functionalized tips to probe the localization and interactions of chemical and biological sites on single native proteins and on living cells at high-resolution.
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June 2014
Best Practices in Imaging Biological Samples In this webinar, we will review and present some details of the general sample preparation methods, for imaging and manipulating DNA, protein, lipid, bacteria and living cells as well as functionalization of AFM probes for specific molecular recognition studies.
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March 2014
Investigating Cell Mechanics with PeakForce QNM® The recent release of Bruker's PeakForce QNM® resolves this limitation and has successfully demonstrated improved results in terms of resolution, speed, ease-of-use, and quality of the information delivered. PeakForce QNM imaging of living cells provides both high-resolution and quantitative two-dimensional spatial maps of cell mechanics that directly correlate to cell topography. Additionally, the different frequencies accessible with both force volume and PeakForce QNM provide new opportunities for examination of viscoelastic properties. In this webinar we will review our latest progress using the BioScope Catalyst™ AFM and PeakForce QNM to study live mammalian and prokaryotic cells, as well as describe the latest NanoScope® and NanoScope Analysis features for acquiring and analyzing nanomechanical measurements.
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March 2014
Nanomechanical AFM Measurements on Biological Samples This webinar reviews typical examples of nanomechanical measurements on biological samples, comparing the benefits of various AFM modes dedicated to these types of investigations.
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Jan 2013
PeakForce Tapping Mode: Enabling High-Resolution Imaging of The DNA Double Helix See the result of advances in AFM instrumentation on DNA.
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Mar 2013

Topic: Nanoelectrochemistry

Title Content Link Date
In-Situ Studies of SEI Evolution in Li-Ion Batteries: Morphology, Mechanics, and Electrochemistry In this joint webinar with Brown University and General Motors, we report in situ and operando characterization of Li-Ion Batteries in a glovebox with < 1 ppm O2 and H2O stable environment. We investigated the formation, evolution and failure mechanisms of SEI layers. PeakForce imaging, with precise, stable force control enables AFM imaging on this previously highly challenging, fragile SEI layer. In this work, one of the key techniques employed is PeakForce SECM for simultaneous characterization of local topographical, mechanical, electrical and electrochemical information. We show for the first time the in-operando cracking of SEI layer and its impact on surface morphology, mechanics, and electrochemistry. Our studies offer guidance to tailor passivation layers for optimal performance of Li-Ion batteries. With guest presenters:
Dr. Xingcheng Xiao is a staff scientist at General Motors Global R&D Center and />Ravi Kumar is a PhD student in Materials Engineering at Brown University.
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PeakForce Scanning Electrochemical Microscopy In this webinar, we introduce a new nanoscale electrochemical measurement: PeakForce scanning electrochemical microscopy (SECM). This is the first complete commercial solution for AFM-based SECM with a spatial resolution less than 100 nanometers for electrochemical mapping. Empowered by PeakForce Tapping, for the first time, electrochemical activity, conductivity (in liquid) and quantitative nanomechanical properties are acquired concurrently. The probes are a crucial element in AFM-based SECM, and are batch-fabricated consistently assuring a high-quality nanoelectrode. Ease of use aspects as well as probe performance & lifetime are illustrated with a range of examples. PeakForce SECM opens the door to new R&D opportunities in biological systems, energy devices such as batteries, as well as catalysis and corrosion. Download

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Sept 2016
In-Situ, in-Operando PeakForce Tapping Imaging of Li-Ion Batteries in a Glovebox In this joint Webinar, we report on in situ and in operando imaging of a Li-ion battery sample using a Dimension Icon AFM in a glove box at < 1 ppm O2 and H2O. Using PeakForce Tapping with its direct, pN level force control, we obtain high resolution images of the extremely fragile SEI layer formed upon cycling on the Si anode. This allows us to investigate the formation, evolution, and failure mechanisms of the SEI layer on patterned Si island structures, showing for the first time the in operando cracking of SEI layer. These results offer guidance for strategies to tailor passivation layers and thus address the key issue of cycling lifetime in higher capacity Li-ion batteries. Download

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December 2015
In-situ Study of Solid Electrolyte Interphase using PeakForce Tapping Mode AFM in Glove-box See Bruker's Chunzeng Li discuss the in-situ study of solid electrolyte interphase with guest speakers Anton Tokranov from the School of Engineering at Brown University and Xingcheng Xiao from General Motors Global R&D Center.
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Aug 2013

Topic: General

Title Content Link Date
Webinar “PeakForce Tapping: modo de Microscopia de Força Atômica para medição de topografia, propriedades mecânicas e elétricas em escala nanométrica O modo PeakForce Tapping (PFT), em conjunto com o Mapeamento de Propriedades Nanomecânicas (PeakForce QNM), assim como as técnicas de caracterização nano-elétricas como PeakForce TUNA (PF-TUNA) e Microscopia de Força Kelvin (KPFM) impulsionaram significativamente as publicações científicas após o seu lançamento pioneiro no mercado.Explicaremos os fundamentos do PeakForce Tapping AFM e os princípios de medição de PeakForce QNM e dos modos eléctricos. Exemplos de aplicações de Ciência de Materiais e Ciências Biológicas serão apresentados. Após esta apresentação, realizaremos uma demonstração ao vivo dos modos mencionados anteriormente.
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June 3 2016
PeakForce Tapping AFM: medición de la topografía, las propiedades mecánicas y eléctricas a escala nanométrica El modo PeakForce Tapping (PFT) junto con el mapeo de propiedades Nanomecánicas (PeakForce QNM), así como técnicas de caracterización nano- eléctricas como Peak Force TUNA (PF-TUNA) y Microscopía de Fuerza Kelvin (KPFM) han mostrado un incremento más rápido de publicaciones utilizando estas técnicas que cualquier otro modo AFM después de su introducción.En este Webinar explicaremos los fundamentos de PeakForce Tapping AFM, junto con los principios de medición de PeakForce QNM y modos eléctricos, también mostraremos ejemplos de aplicaciones de Ciencia de Materiales y Ciencias de la Vida. Después de esta presentación realizaremos una demostración en vivo mostrando lo ya mencionado anteriormente.
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March 2015
AFM in the World of LEDs Atomic Force Microscopy applications in the development and production process of LEDs/OLEDs
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April 2013

Topic: AFM Imaging

Title Content Link Date
Silicon Nanowire Hybrid Metrology for the 7nm Node Data presented in collaboration with IBM and Applied Materials
This webinar presents the role of Atomic Force Microscopy (AFM) in hybrid metrology for current and future node semiconductor devices. The gate all-around silicon nanowire (GAASiNW) is one such structure that is under investigation for introduction at the 7nm node. A recent case study in which Hybrid Metrology between a CD-SEM and the AFM was used to investigate the buckling characteristics of 7nm silicon nanowires will be presented.
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April 2014
PeakForce Tapping and ScanAsyst An introduction to ScanAsyst and PeakForce Tapping featuring Bruker’s Dimension Edge
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May 2013

Topic: Polymers

Title Content Link Date
Nondestructive Characterization of Advanced Polymeric Materials joint webinar hosted on C&EN
This joint webinar will focus on polymer materials characterization using the highly complementary techniques of Atomic Force Microscopy (AFM) and vibrational (infrared and Raman) spectroscopy.
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March 2015
Nanochemistry, Plasmonics, and Correlated Imaging Access New Information
with Inspire and PeakForce IR

The Bruker Inspire system enables new measurements of nanoscale chemistry and properties. Inspire extends Bruker’s proprietary PeakForce Tapping technology to nanoscale imaging of infrared absorption and reflection. This webinar focuses on the latest technology advances and expanding applications range addressed by this system, from nanoscale polymer chemistry to graphene plasmonics and unraveling complex systems with high resolution, correlative imaging.
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October 2014

Topic: Favorites

Title Content Link Date
Accelerate Your AFM Research: New Capabilities enabled by upgrading MultiMode and Dimension Platforms Explained Dr Hartmut Stadler, Bruker, presents an interactive webinar highlighting new research that can be carried on Dimension and MultiMode platforms by upgrading or trading into to latest generation technology.
The webinar aims to provide research leaders and AFM users ideas for new research not previously accessible using AFM and evidence based justification to upgrade old AFM systems.
(In English)
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April 2014
Accelerate Your AFM Research: New Capabilities enabled by upgrading MultiMode and Dimension Platforms Explained Dr Hartmut Stadler, Applications Scientist – Bruker Nano Surfaces Division, will present and interactive webinar highlighting new research that can be carried on Dimension and MultiMode platforms by upgrading or trading into to latest generation technology.
(In German)
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contact us to watch the recording

March 2014
Empowering Today's Nanoscale Research with PeakForce Tapping In this webinar we take a look at the growth of Peak Force Tapping in AFM research and review some of the key publications in a wide range of fields that have made use of Peak Force Tapping. Topics range over material property mapping at the nanoscale in the fields of materials, high resolution imaging, bimolecular and cell biology, batteries, graphene, organic photovoltaic, etc. Attendees will also receive a link where they can download a citation list of key publications that can be imported into popular bibliography management software packages.
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January 2014
The AFM Probe - Fundamentals, Selection, and Applications In this webinar, the information and probe knowledge used by AFM experts to select a probe is presented.
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Oct 2013
How Does Atomic Force Microscopy Work and What Can It Do? Dr. Chunzeng Li explains, in a simple manner, how AFM works and showcases some of the many things it can do.
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Dec 2013

2012 Archive

Title Content Link Date
Combined Optical and Atomic Force Microscopy
Download the PDF copy Jan 2012
Advances in NanoScale Thermal Analysis: Transition Temperature Microscopy
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Feb 2012
The Powerful Diversity of the AFM Probe
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Mar 2012
AFM Enhancing Traditional Electron Microscopy Applications
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Apr 2012
Advancing AFM for Cell Biology: The Role of Forces in Cell Structure and Behavior
Watch the recording online May 2012
Atomic Imaging with Peak Force Tapping
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Jun 2012
Recent Progress in AFM and Nanomedicine - Applications of Force Spectroscopy and Peak Force Tapping
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Jul 2012
High Resolution Quantitative Kelvin Probe Force Microscopy
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Aug 2012
Advances in TERS Applications
Register and watch the recording Sept 2012
Comparative and Correlative imaging of polymers and biological samples by SEM, TEM and AFM
Watch the recording online Nov 2012
Measuring Absolute Values of Modulus of Elasticity for Soft Materials with AFM
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Dec 2012