Bruker Nano Analytics presents

European EDS User Meeting

Including a microanalysis online workshop on EDS, WDS, EBSD and µXRF on S(T)EM

 

2022 Oct 6 - 7 

With Keynote Speakers from CEA, Weizmann Institute, FBH, IIT, CIGS, and the Natural History Museum

The Bruker Nano Analytics' European EDS User Meeting is the opportunity to discuss your research with a wider community of scientists, review your applications and our technological developments with our experts, as well as understand how to get the most out of your system. 

 

Dates, Times and Full Agenda

  • Thursday 6 October: 10:00 - 16:30 (CEST) - with lunch break of an hour and thirty minutes
  • Friday 7 October: 10:00 - 16:15 (CEST) - with lunch break of an hour and fourty-five minutes

 

Day 1 - Thursday 6 October
Time Topic Speaker

10:00

Advanced Chemical Analysis of Nanostructures using a WDX spectrometer for SEM

Dr. Eric Robin, CEA Grenoble (FR)
10:25 X-ray Volume Generation: A Case Study Dr. Massimo Tonelli, CIGS Modena (IT)

10:50

What's New in EDS Technology Development for SEM: XFlash® 7!

Andi Kaeppel, Bruker Nano Analytics (DE)

11:10 Break  -
11:25 TEM Study of Colloidal Lead Halide Perovskite Nanocrystals for Optoelectronics Dr. Rosaria Bresica, IIT Genoa (IT)

11:50

Optimization of UV-LED Devices for Skin-Tolerant Inactivation of SARS-CoV-2 and Multi-Resistant Bacteria: Analytical STEM and SEM Study

Dr. Anna Mogilatenko, Leibnitz Institut für Höchstrequenztechnik (DE)

12:15

Q&A Session

-

12:30 Lunch Break -

14:00

Expanding the Limits of SEM-EDS

Dr. Ifat Kaplan-Ashiri, Weizmann Institut (IL)
14:25 Advancing SEM/EDS for Samples Out of Space Using the FlatQUAD Dr. Tobias Salge, Natural History Museum London (UK)
14:50 Element Analysis using EDS in TEM and STEM: Challenges and Possibilities Dr. Meiken Falke, Bruker Nano Analytics (DE)
15:10 Break -

15:20

Quantifying EDS Data: A Review

Dr. Ralf Terborg, Bruker Nano Analytics (DE)

15:45 Inter-Laboratory Comparison for EDS Quantification Results Dr. Martin Bühner, NanoAnalytics GmbH (DE)
16:10 Supporting your System to provide the Best Experience for You  Dr. Robert Seher, Bruker Nano Analytics (DE)
16:30  Closing Q&A Session  -
Day 2 - Friday 7 October

The workshop on Day 2 will be held across two parallel sessions - participants can select between the sessions of their interest in room 1 and room 2.

Time Room 1 Room 2
10:00 Quantification of STEM EDS Data Automation Workflows & Solutions for Large Area Mapping
10:45 Best Practice: EDS Workflow -
11:30 Best Practice: EBSD Workflow Working with Beam-Sensitive Samples: Advantage of Double Detector & FQ
12:15 Lunch
14:00 Introduction to Quantification & Advice when Working with Standards -
14:45 Best Practice: WDS Workflow XFlash® 7 Highlights
15:30 Demonstration of XTrace: micro-XRF on SEM Easy EDS Analysis with ESPRIT Compact
16:15 Closing Q&A Session

Secure your Space - Register Now

If you are interested in participating please register now to secure your space.