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Advances in AFM and nanoIR Technology: New Modes to Enable Research

Oct. 31, 2019 | Georgia Institute of Technology, Atlanta, GA

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Invitation

The Georgia Institute of Technology and Bruker are pleased to present an atomic force microscopy (AFM) and nanoscale infrared (nanoIR) spectroscopy workshop on Thursday, October 31, 2019. During the workshop, we will explore the latest advances in AFM and nanoIR technologies, and perform hands-on demonstrations with Bruker’s Dimension Icon AFM.

If you have any questions, please contact Thomas Zhang at 352.222.1686.

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Workshop Location

Georgia Institute of Technology
Molecular Science and Engineering Building, Room 3201A
901 Atlantic Dr., Atlanta, GA 30318

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Parking

Visitor Area 5 - W23 (next to MSE building)
911 State St. NW, Atlanta, GA 30318

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Workshop Agenda

Thursday, October 31

Time Session
8:15 AM Registration
8:45 AM Opening Remarks and Introduction to Bruker
• Prof. Vladimir Tsukruk, Georgia Institute of Technology and Thomas Zhang, Bruker
9:00 AM Brief History of AFM Applications to Soft Materials
• Prof. Vladimir Tsukruk, Georgia Institute of Technology - View Abstract
9:30 AM Probing the Time-Temperature Relationship of Mechanical Properties with AFM-based Dynamic Mechanical Analysis
• Dr. Bede Pittenger, Bruker - View Abstract
10:00 AM Coffee Break
10:15 AM Atomic Force Microscopy in the Rubber Industry: Micro-Scale Dispersion in Filled Rubber Compounds
• Dr. Seth Young, Birla Carbon - View Abstract
10:45 AM Latest Advances in Nanoscale IR Spectroscopy and Imaging
• Dr. Curtis Marcott, Light Light Solutions - View Abstract
11:30 AM Recent Bruker AFM Application Development in NanoElectrical Research
• John Thornton, Bruker - View Abstract
12:00 PM Lunch (provided)
1:00 PM AFM-nDMA Hands-on Session I
2:45 PM AFM-nDMA Hands-on Session II
4:30 PM Closing Remarks

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