Electronic Materials

As electronic devices shrink, electrical characterization becomes more important—and more challenging.

Electronic materials are the foundation of the devices we use daily to make our lives easier and more productive, and are a key building block for the technologies of the future. As we demand more capability from these devices—faster computing, brighter lights, smaller components—the need grows for correlated physical and electrical characterization at the nanometer scale.

Bruker provides an extensive suite of electrical characterization modes for atomic force microscopy, available on multiple platforms. In addition to classic electrical modes such as Electric Force Microscopy (EFM) and Conductive AFM (CAFM), Bruker has recently expanded the collection with the addition of Photoconductive AFM (pcAFM) and variations of TUNA and KPFM incorporating innovative PeakForce TappingTM technology.

Bruker also supports the development and characterization of electronic materials by delivering instruments for the spatially resolved, non-destructive material analysis. Using Micro-XRF, spatially resolved (or mapping) or layer thickness analysis of electronic materials can be performed to determine their chemical composition down to trace levels without any specimen preparation. The M4 TORNADO offers spatial resolution down to below 20 µm. However, for non-destructive spatially resolved chemical analysis of smaller structures, down to the nanometer range, the electron microscope analyzer range is the optimal solution. Here the QUANTAX EDS for chemical analysis and QUANTAX EBSD for crystallographic analysis are used on scanning electron microscopes.