D8 ADVANCE, X-ray diffraction

D8 ADVANCE Plus

The D8 ADVANCE Plus combines maximum flexibility with unparalleled ease-of-use, perfectly matching the analytical needs of epitaxial and polycrystalline thin film, bulk and powder samples under ambient and non-ambient conditions.

Thanks to TRIO optics, switching between different instrument geometries is done with the push of a button, reliably without user intervention.

  • Unparalleled powder diffraction with Bragg-Brentano geometry
  • Superb resolution at high intensity on epitaxial samples
  • Optimum polycrystalline thin film diffraction in Grazing Incidence Geometry
  • XRR to determine film thickness from 0.1 nm up to 250 nm

 

Please read more about the D8 ADVANCE Plus in the press release.

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