Training Courses at the Factory

Bruker offers advanced applications training courses for atomic force microscopes and 3D optical microscopes at our factories. Learn from our applications experts. The classes include both theory sessions and lab sessions. These courses are an excellent way to raise your level of proficiency and get that extra productivity out of your instrument. Students are invited to bring their own samples to practice on our state-of-the-art equipment.

AFM Courses in the United States

Course	Date	Description
AFM Electrical Measurements	May 23-25, 2017	Santa Barbara, CA 3-Day course covering KPFM, SCM & TUNA, and Piezo Force Microscopy
AFM Biological Applications	Aug 29- 31, 2017	Santa Barbara, CA 3-Day course covering DNA & Live Cell Imaging, PF-QNM on Bio Samples, and Force Spectroscopy
Image Quality and PeakForce QNM	November 14-16, 2017	Santa Barbara, CA 3-Day course covering Image Quality, Peak Force-QNM, and Fluid Imaging
Optical Metrology Advanced Applications Course	Oct 17-20, 2017	Tucson, AZ 4-day course providing in depth theories of Vision measurement modes and optimization of parameters to obtain better surface data.

Training Courses in the UK

Course	Date	Description
Basic AFM Modes Training Class	September 05-07, 2017	Coventry, UK In this 3 day course we will give you the opportunity to deepen your experience with the Nanoscope AFM systems. Imaging modes like Tapping Mode, Contact Mode and ScanAsyst Mode will be presented as well as working in liquids.
PFQNM in air and liquid	October 31- November 02, 2017	Coventry, UK During the 3-day course we like to improve the user knowledge of quantitative PEAK FORCE nanomechanical mapping (PFQNM). In theory sessions we will present the theoretical background of this method and discuss the different calibration opportunities in PFQNM.

Training Courses in Singapore

Course	Date	Description
Advanced AFM Training	16-Jun	Helios, Singapore Advanced AFM Training on Image Modes Review, Understanding Noise, Artifacts and Fluid Imaging
Advanced AFM Applications Training	15-18 Aug	Helios, Singapore Advanced AFM Applications Training on Nano-Mechanical Characterization and Electrical Characterization
Operation and Applications Training	10-Nov	Helios, Singapore Bruker Optical 3D Microscope Operation and Applications Training

Training Courses in Brazil

Course	Date	Description
AFM Introduction Course	May 31 – June 02, 2017	Atibaia/SP, Brazil General introduction to AFM imaging techniques, with concise theoretical presentations and hands-on sessions on a Dimension FastScan.

Training Courses in Germany

Course	Date	Description
Service Training - Dektak XT	August 24, 2017	Karlsruhe, Germany Bruker Nano Surfaces Division cordially invites you to our “Stylus Profilometry“ Training Sessions, which will be held on August 24th 2017, in Karlsruhe, Germany. Are you new to the community? Would you like to brush up your practical skills and learn more about new developments in the theory and technology?
Image Quality and Fluid Imaging Course	September 12th, 2017	Karlsruhe, Germany Technology of Optical Profilers. Introduction to Interferometry. Phase Shift Interferometry (PSI), Vertical Scan Interferometry (VSI) and advanced VSI (VXI).Vision64 - Introduction Vision Software Overview & Basic Measurement Options Measurement Techniques - Easy to Difficult Samples Calibration, Reference Generation ; Measurements with Customer Samples; focus on fundamentals and obtaining good single measurements; Advanced measurement Options, Data/Image manipulation, Processed Options, Terms Removal, Masking, Data Restore ;Demonstrate advanced measurements; Stitching, Multiple Region Analysis, Filtering; Questions and answers.
Application Modules	October 17 - 19, 2017	Karlsruhe, Germany The focus on this 3 day course lies on working with PFTUNA and PFKPFM modules. We will present the theory of both methods and help you to obtain better results. Besides the theoretical part we will also have hands on training. Modules used will be the PFTUNA module and the KPFM module on the Multimode and/or the Dimension Icon.
Basic AFM Modes	October 24 - 26, 2017	Karlsruhe, Germany In this 3 day course we will give you the opportunity to deepen your experience with the Nanoscope AFM systems. Imaging modes like Tapping Mode, Contact Mode and ScanAsyst Mode will be presented as well as working in liquids. In addition to this we would help you to find appropriate probes for your experiments. We will also explain offline analysis. Besides the theory of AFM we will offer hands on training on our AFM systems. Multimode and/or the Dimension Icon will be used. The course will be in English.
PFQNM in air and liquid	November 07 – 09, 2017	Karlsruhe, Germany During the 3-day course we like to improve the user knowledge of quantitative PEAK FORCE nanomechanical mapping (PFQNM). In theory sessions we will present the theoretical background of this method and discuss the different calibration opportunities in PFQNM.

Training Courses in France

Course	Date	Description
Application Modules	May 30 – June 02, 2017	Palaiseau, France The focus on this 3 day course lies on working with PFTUNA and PFKPFM modules. We will present the theory of both methods and help you to obtain better results.
Basic AFM Modes Training Class	Octobre 03-05, 2017	Palaiseau, France In this 3 day course we will give you the opportunity to deepen your experience with the Nanoscope AFM systems. Imaging modes like Tapping Mode, Contact Mode and ScanAsyst Mode will be presented as well as working in liquids.
PFQNM in air and liquid	September 05 - 07, 2017	Palaiseau, France During the 3-day course we like to improve the user knowledge of quantitative PEAK FORCE nanomechanical mapping (PFQNM). In theory sessions we will present the theoretical background of this method and discuss the different calibration opportunities in PFQNM.

Online Application Courses

In 2015 Bruker kicked off a series of training courses online. Register for the live training session or watch the recording post live-event. These one-hour sessions are designed to provide in-depth detail and instruction on specific "mini-topics", making learning easy and digestible.

Online Training Classes

Date	Time	Topic
Online	Aug 22, 2017 2:00 PM - 3:20 PM CEST	AFM PeakForce QNM Part 1 In this two part webinar we like to present the key parameters for succesful PFQNM measurements with the AFM. Best known methods for probe selection and calibration will be shown in part one. Register Here
Online	Aug 23, 2017 2:00 PM - 3:30 PM CEST	AFM PeakForce QNM Part 2 Part two of the PFQNM webinar concentrates on image/data optimization of PFQNM images and data analysis. Troubleshooting Peak Force measurements will be discussed as well Register Here
Online	Aug 24, 2017 2:00 PM - 3:30 PM CEST	AFM PeakForce KPFM Training In this webinar we like to show the advantages of PeakForce KPFM versus Tapping Mode and Contact Mode Kelvin Probe Microscopy. Best known methods for probe selection and sample preparation will be presented. Register Here
Online	Aug 25, 2017 2:00 PM - 3:30 PM CEST	AFM PeakForce TUNA Training Best known methods of Peak Force Tunneling AFM measurements will be presented in this webinar. The presentation will cover probe selection, sample preparation and the main parameters for succesful measurements Register Here
Online	Sep 12, 2017 2:00 PM - 3:30 PM CEST	Basic White Light Interferometry Training Technology of Optical Profilers. Introduction to Interferometry. Phase Shift Interferometry (PSI), Vertical Scan Interferometry (VSI) and advanced VSI (VXI) Register Here
Online	Oct 27, 2017 1:00 PM - 2:30 PM CEST	High-Resolution AFM Training In this online webinar we like to present best known methods to achieve high resolution imaging with Bruker AFM systems. STM and AFM parameter settings will be shown. Troubleshooting for high resolution imaging will be discussed as well. Register Here
Online	Oct 23, 2017 2:00 PM - 3:30 PM CEST	AFM Image Optimization Training In this webinar we discuss the influence of the most important parameters to optimize AFM measurements in Contact, Tapping and Scan Asyst mode. Best known methods to improve the image quality will be shown. Register Here
Online	Aug 25, 2017 2:00 PM - 3:30 PM CEST	Stylus Profilometry Training - Dektak XT Topics: General Introduction Dektak XT, Parameter Setup, Stylus and Force selection, Step Detection, N-Lite, Safe Mode, Calibration, Database Register Here
Online		Advanced Functions of Nanoscope Software View the Recording at Your Convenience
Online		Piezoresponse Force Microscopy View the Recording at Your Convenience
Online		NanoTA/SThM View the Recording at Your Convenience
Online		Interleave & Lift Mode View the Recording at Your Convenience
Online		Live Remote Web Session Training Combining automation & speed to deliver true microscopy with the AFM Dimension FastScan Contact us to have the password and view the recording at your convenience
Online		Live Remote Web Session Training Measuring elastic & viscoelastic mechanical properties of living cells using BioScope Resolve AFM: PeakForce QNM, FASTForceVolume, creep response, dynamic mechanical analysis (DMA) Contact us to have the password and view the recording at your convenience
Online		AFM Probe Selection View the Recording at Your Convenience
Online		Live Remote Web Session Training Setting up the parameters and best practice for high-resolution molecular imaging using PeakForce Tapping mode in liquid Contact us to have the password and view the recording at your convenience
Online		PeakForce Tapping Optimization View the Recording at Your Convenience
Online		PF-QNM I: Force Spectroscopy View the Recording at Your Convenience Take the Quiz
Online		PF-QNM II: Quantitative Nanomechanical Mapping Calibration View the Recording at Your Convenience Take the Quiz
Online		KPFM I: Amplitude Modulation View the Recording at Your Convenience Take the Quiz
Online		KPFM II: Frequency Modulation View the Recording at Your Convenience Take the Quiz
Online		Image Quality View the Recording at Your Convenience Take the Quiz
Online		Image Processing View the Recording at Your Convenience
Online		TUNA/PF-TUNA View the Recording at Your Convenience Take the Quiz
Online		Scanning Capacitance Microscopy View the Recording at Your Convenience Take the Quiz
Online		Advanced Functions Nanoscope Analysis View the Recording at Your Convenience
Online		Atomic Resolution View the Recording at Your Convenience

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