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TOPAS Rietveld Quantification and Indexing – Application Training

About the training

This training course will show the different methods used for quantitative phase analysis, with the main focus on using DIFFRAC.TOPAS software package. The course is intended for users with experience in XRD, new users are strongly encouraged to first attend the Basics of X-ray Diffraction and DIFFRAC.EVA course.

 

Course Outline and Agenda

Day 1, 9am - 5pm

  • Introduction to DIFFRAC.TOPAS
  • Profile fitting and Microstructure analysis

 

Day 2, 9am - 5pm

  • Quantitative analysis using Rietveld method
  • Amorphous content determination
  • Quantification using an external standard
  • Indexing

More details

Class size

Class sizes are limited, so that each participant receives individual attention and participates in all hands-on activities. Early registration is encouraged as registrations are accepted on a first-come/first-served basis.

 

Attendance Fee

The course price includes course materials, lunch and refreshments. Travel and accommodation are not included.

 

Cancellation

Registrations cancelled within 10 working days prior to the start of the course are subject to a cancellation fee of 30 %. Registered persons not attending the course without having given prior notice will be fully charged. We reserve the right to cancel a course if there are less than three registrants by the registration deadline.

 

Our Facility

Bruker India Scientific Pvt. Ltd.
40/1 Century Corbel Commercial, 1st Floor
G Block, 60 Feet Road, Sahakar Nagar
Bangalore 560092
India

See all XRD trainings at Bruker AXS

 

Contact

For registration or other questions, please contact: applab.baxs.ime@bruker.com