Line and spot focus capability for various wavelengths sets the foundation for ultimate flexibility to cover a wide range of applications including powder diffraction, thin-film analysis and materials research.

Combine advanced sources such as the TXS-HE or IµS with MONTEL^Plus and the outstanding accuracy of the ATLAS goniometer for unrivalled analytical capability - efficiency by better data in shorter time. 

D8 DISCOVER for the automated offcut analysis on ingots and wafers. The photo shows a setup with heavy weight-load sample stage, surface alignment attachment and LYNXEYE detector.

D8 DISCOVER HTS² for high-throughput screening in transmission and reflection geometry. The photo shows a set-up with IµS X-ray source, PILATUS3 R 100K-A 2D detector and 4-position well-plate sample stage.