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表面分析

Infrared and Raman spectroscopy allow a quick identification and characterization of the chemical properties of surfaces. Combined with microscopy chemical images with a lateral resolution in the micrometer range can be measured.

Infrared spectroscopy is a powerful method for the analysis of the chemical composition of surfaces. Using reflection techniques like Attenuated Total Reflection (ATR) and Reflection-Absorption-Spectroscopy (IRRAS) measurements can be performed on various substrates and at interfaces. In quality control the ALPHA can be used to verify the cleanliness of metallic surfaces by a contactless measurement.

The Raman microscope SENTERRA II can be utilized for the contactless analysis of coatings, particularly on DLC and silicon. Furthermore its confocal design allows the measurement at interfaces, e.g. on the surface of catalysts.