In Situ SEM Nanomechanics with Bruker’s PicoIndenter – Webinar and Demonstration of Hysitron SEM PicoIndenter
Join us for the one and half hour webinar, led by experts in the field, to discuss in situ nanomechanics with challenging samples and under extreme conditions in the scanning electron microscope.
This webinar took place on
October
28th 2020
Register to download slides & media
Media
Overview
In this webinar, two experts in the field of in situ nanomechanics present their latest research. Dr. Kris Vanstreels’s talk will be focused on understanding the strength and reliability of back-end-of-the-line (BEOL) layer stacks, which are utilized in the microelectronics industry. Dr. Peter Hosemann will discuss deformation mechanisms of materials at cryogenic temperatures. After the guest speakers conclude their presentations, the Bruker team will introduce and demonstrate the next generation Hysitron SEM PicoIndenter.
Agenda:
- Mechanical stability of advanced nano-interconnects -- Dr. Kris Vanstreels, IMEC
- Micromechanical testing at cryostatic temperatures fracture and microstructural changes evaluated -- Dr. Peter Hosemann, UC Berkeley
- Demonstration -- Eric Hintsala and Sanjit Bhowmick, Bruker
Speakers
Sanjit Bhowmick, Ph.D.
Senior Staff Scientist, Bruker
Dr. Eric Hintsala
Applications Scientist
Applications Scientist, Bruker (Hysitron Products)
Dr. Kris Vanstreels
Researcher, Interuniversity Microelectronics Centre (IMEC), Belgium
Mechanical and thermal modeling and characterization
Interuniversity Microelectronics Centre (IMEC), Belgium
Dr. Peter Hosemann
Professor and Chair
Department of Nuclear Engineering at the University of California, Berkeley, USA