SHANGHAI, CHINA – March 17, 2015 – At the 24th China International PCB and Assembly Show (CPCA), Bruker today introduces the M2 BLIZZARD, a small-spot X-ray fluorescence (XRF) spectrometer specifically designed for the nondestructive analysis of printed circuit boards (PCB) in accordance with ASTM B568 and DIN/ISO 3497 standards. Utilizing Bruker’s XSpect Pro and XData software packages, the M2 BLIZZARD enables characterization of metal multilayer systems, consisting of up to 12 layers with up to 25 elements each, with regard to composition and thickness.
The slotted sample chamber and the large tray support fast and precise positioning of all types of PCBs from small to oversized which may even exceed the sample chamber. Its rugged construction allows the M2 BLIZZARD to be used on the shop floor.
The M2 BLIZZARD is available with a high-performance silicon drift detector which is suitable for the analysis of thinner layers and unknowns as well as for routine analysis. It is equipped with a powerful video microscope system with auto focus function. User convenience is further enhanced by support of an optional industrial-strength foot switch and touchscreen operation.
Ease-of-use and flexibility have been the emphasis in the design of system soft- and hardware. The M2 BLIZZARD provides experienced users or supervisors with a comprehensive range of tools and options for creation of measurement and evaluation methods specifically tailored to the sample type at hand. Once defined, these methods can be routinely used by staff at the production site or in the QC lab to perform the actual analyses for quality control in a simple push-button mode. Setting up and performing these analyses is intuitive so that introductory operator training is sufficient. The PASS/FAIL determination or trend line display with upper and lower control limits let the operator see immediately whether a sample is of good quality or not. Reporting and data archiving functions are included as well as data export to Excel®.