“The Peter Duncumb Award for Excellence in Microanalysis recognizes outstanding achievement in the field of microanalysis through technical accomplishment, leadership, and educational and professional activities,” says the website of the Microanalysis Society (MAS). It is awarded annually to a person currently active in his or her career nominated by the MAS members and finally selected by the MAS council. Bruker Nano has the pleasure of being the sole sponsor of this prestigious award since it was first given in 2007.
The Peter Duncumb Award was given for the 7th time during the Microscopy & Microanalysis meeting in Indianapolis, IN in August 2013. The most deserving winner of the 2013 award is Professor Eric Lifshin. He is known to many as co-author of the popular book “Scanning Electron Microscopy and X-ray Microanalysis”, which is a standard text in the field and one of the many important publications during the course of his career.
Eric Lifshin is a full professor at the College of Nanoscale Science and Engineering (CNSE), University at Albany, State University of New York. Apart from teaching and research in microscopy and microanalysis at CNSE, he has also been a lecturer at the Lehigh SEM courses since their beginning in 1970. He received his B.S., M.S., and Ph.D. from Rensselaer Polytechnic Institute. In 1963 he joined GE, where he worked in various positions, among them Manager of the Characterization and Environmental Technology Laboratory, which he held for 25 years until his retirement in 2000.