Contour Elite K Banner Cv1

The Contour Elite™ K is designed specifically for investigating widely varying samples without damage to the sample surface. The system utilizes white light interferometry (WLI) to perform rapid, 3D, non-contact surface measurements of widely varying sample features. With the ability to capture nano- to macroscale surface features, Contour Elite is adept at imaging deep trenches, high-aspect ratio holes, as well as samples with high or low topographic relief or even curvature.

 

 

The Elite K’s proven hardware platform, powerful Vision64® software, new imaging capabilities, and non-destructive measurement techniques make it the metrology tool of choice for a wide range of demanding applications. Offering many customization options for specific applications, Contour Elite is well-suited for R&D metrology as well as for the rigorous measurement requirements of high-throughput, production environments.

 

 

導入されている広範な産業の例:

Medical Devices and Implants figure C 50x50

医療機器およびインプラント

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Automotive and Aerospace figure C 50x50

自動車および航空宇宙

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Precision Machining figure D 50x50

精密加工

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Semiconductor and Microelectronics figure E 50x50

半導体およびマイクロエレクトロニクス

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