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TAPTimesMCMpanelinspection 697 kB
Test, ASsembly & Packaging TIMES, Feb 2013 Published article by Dr. Matt Novak about the challenges and use of metrology on multichip modules in the electronic panel industry.

3D Optical Microscopy 548 kB
Novus Light Technologies Today, January 2013 Article discussing the measurement of surface topography using 3D optical microscopes in a variety of industries.